A. Guédon-Gracia

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2005

1 A. Guédon-Gracia, E. Woirgard, C. Zardini: Correlation between Experimental Results and FE Simulations to Evaluate Lead-Free BGA Assembly Reliability. Microelectronics Reliability 45(9-11): 1652-1657 (2005)

	2005
1		A. Guédon-Gracia, E. Woirgard, C. Zardini: Correlation between Experimental Results and FE Simulations to Evaluate Lead-Free BGA Assembly Reliability. Microelectronics Reliability 45(9-11): 1652-1657 (2005)

Coauthor Index

1 E. Woirgard [1]

2 C. Zardini [1]