G. Guégan

	2002
3		M. Fadlallah, G. Ghibaudo, J. Jomaah, M. Zoaeter, G. Guégan: Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability 42(1): 41-46 (2002)
2		B. Cretu, F. Balestra, G. Ghibaudo, G. Guégan: Origin of hot carrier degradation in advanced nMOSFET devices. Microelectronics Reliability 42(9-11): 1405-1408 (2002)
	2001
1		F. Lime, G. Ghibaudo, G. Guégan: Stress induced leakage current at low field in ultra thin oxides. Microelectronics Reliability 41(9-10): 1421-1425 (2001)

Coauthor Index

1	F. Balestra	[2]
2	B. Cretu	[2]
3	M. Fadlallah	[3]
4	G. Ghibaudo	[1] [2] [3]
5	J. Jomaah	[3]
6	F. Lime	[1]
7	M. Zoaeter	[3]