Luca Guerrazzi

	1996
2		Roberto Bevacqua, Luca Guerrazzi, Franco Fummi: SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation. EUROMICRO 1996: 351-
1		Roberto Bevacqua, Luca Guerrazzi, Fabrizio Ferrandi, Franco Fummi: Implicit Test Sequences Compaction for Decreasing Test Application Cos. ICCD 1996: 384-382

Coauthor Index

1	Roberto Bevacqua	[1] [2]
2	Fabrizio Ferrandi	[1]
3	Franco Fummi	[1] [2]