 | 2009 |
| 21 |  | Wanfu Ding,
Ruifeng Guo:
An Effective RM-Based Scheduling Algorithm for Fault-Tolerant Real-Time Systems.
CSE (2) 2009: 759-764 |
| 20 |  | Xun Tang,
Ruifeng Guo,
Wu-Tung Cheng,
Sudhakar M. Reddy:
Improving compressed test pattern generation for multiple scan chain failure diagnosis.
DATE 2009: 1000-1005 |
| 2008 |
| 19 |  | Wanfu Ding,
Ruifeng Guo:
Design and Evaluation of Sectional Real-Time Scheduling Algorithms Based on System Load.
ICYCS 2008: 14-18 |
| 18 |  | Yu Huang,
Ruifeng Guo,
Wu-Tung Cheng,
James Chien-Mo Li:
Survey of Scan Chain Diagnosis.
IEEE Design & Test of Computers 25(3): 240-248 (2008) |
| 2007 |
| 17 |  | Vishnu C. Vimjam,
Enamul Amyeen,
Ruifeng Guo,
Srikanth Venkataraman,
Michael S. Hsiao,
Kai Yang:
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology.
VTS 2007: 231-238 |
| 2006 |
| 16 |  | Ruifeng Guo,
Subhasish Mitra,
Enamul Amyeen,
Jinkyu Lee,
Srihari Sivaraj,
Srikanth Venkataraman:
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive.
VTS 2006: 66-71 |
| 15 |  | Ruifeng Guo,
Srikanth Venkataraman:
An algorithmic technique for diagnosis of faulty scan chains.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(9): 1861-1868 (2006) |
| 2005 |
| 14 |  | Dong Yu,
Hu Lin,
Ruifeng Guo,
Jiangang Yang,
Pengfei Xiao:
The Research on Real-Time Middleware for Open Architecture Controller.
RTCSA 2005: 80-83 |
| 2004 |
| 13 |  | Srikanth Venkataraman,
Srihari Sivaraj,
Enamul Amyeen,
Sangbong Lee,
Ajay Ojha,
Ruifeng Guo:
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor.
VTS 2004: 23-30 |
| 2003 |
| 12 |  | Xiaoming Yu,
Enamul Amyeen,
Srikanth Venkataraman,
Ruifeng Guo,
Irith Pomeranz:
Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation.
VTS 2003: 351-358 |
| 11 |  | Ruifeng Guo,
Sudhakar M. Reddy,
Irith Pomeranz:
Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 293-304 (2003) |
| 10 |  | Ruifeng Guo,
Sudhakar M. Reddy,
Irith Pomeranz:
PROPTEST: a property-based test generator for synchronous sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(8): 1080-1091 (2003) |
| 2001 |
| 9 |  | Ruifeng Guo,
Sudhakar M. Reddy,
Irith Pomeranz:
On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits.
Asian Test Symposium 2001: 82- |
| 8 |  | Ruifeng Guo,
Srikanth Venkataraman:
A technique for fault diagnosis of defects in scan chains.
ITC 2001: 268-277 |
| 7 |  | Ruifeng Guo,
Irith Pomeranz,
Sudhakar M. Reddy:
On Improving Static Test Compaction for Sequential Circuits.
VLSI Design 2001: 111-116 |
| 1999 |
| 6 |  | Ruifeng Guo,
Sudhakar M. Reddy,
Irith Pomeranz:
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction.
DAC 1999: 653-659 |
| 5 |  | Yun Shao,
Ruifeng Guo,
Sudhakar M. Reddy,
Irith Pomeranz:
The effects of test compaction on fault diagnosis.
ITC 1999: 1083-1089 |
| 4 |  | Ruifeng Guo,
Irith Pomeranz,
Sudhakar M. Reddy:
A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits.
VTS 1999: 260-267 |
| 3 |  | Irith Pomeranz,
Sudhakar M. Reddy,
Ruifeng Guo:
Static test compaction for synchronous sequential circuits based on vector restoration.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(7): 1040-1049 (1999) |
| 1998 |
| 2 |  | Ruifeng Guo,
Irith Pomeranz,
Sudhakar M. Reddy:
On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits .
Asian Test Symposium 1998: 467-471 |
| 1 |  | Ruifeng Guo,
Irith Pomeranz,
Sudhakar M. Reddy:
Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration.
DATE 1998: 583- |