Z. Gur

	2005
1		Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein: Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED 2005: 382-389

Coauthor Index

1	Joseph B. Bernstein	[1]
2	Bing Huang	[1]
3	Xiaojun Li	[1]
4	J. Qin	[1]
5	Michael Talmor	[1]
6	X. Zhang	[1]