Nazar S. Haider
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1993
1
Nazar S. Haider,
Nick Kanopoulos
: Efficient board interconnect testing using the split boundary scan register.
J. Electronic Testing 4
(2): 181-189 (1993)
Coauthor Index
1
Nick Kanopoulos
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1
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Copyright ©
Wed Nov 25 14:46:41 2009 by
Michael Ley
(
ley@uni-trier.de
)