Yue Hao

	2008
14		JinFeng Zhang, Yue Hao, JinCheng Zhang, JinYu Ni: The mobility of two-dimensional electron gas in AlGaN/GaN heterostructures with varied Al content. Science in China Series F: Information Sciences 51(6): 780-789 (2008)
	2007
13		Ming-e Jing, Yue Hao, Dian Zhou, Xuan Zeng: A Novel Optimization Method for Parametric Yield: Uniform Design Mapping Distance Algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 26(6): 1149-1155 (2007)
	2005
12		Yue Hao, Jiming Liu, Yuping Wang, Yiu-ming Cheung, Hujun Yin, Licheng Jiao, Jianfeng Ma, Yong-Chang Jiao: Computational Intelligence and Security, International Conference, CIS 2005, Xi'an, China, December 15-19, 2005, Proceedings, Part I Springer 2005
11		Yue Hao, Jiming Liu, Yuping Wang, Yiu-ming Cheung, Hujun Yin, Licheng Jiao, Jianfeng Ma, Yong-Chang Jiao: Computational Intelligence and Security, International Conference, CIS 2005, Xi'an, China, December 15-19, 2005, Proceedings, Part II Springer 2005
10		Junping Wang, Yue Hao: Short Critical Area Computational Method Using Mathematical Morphology. CIS (2) 2005: 796-803
9		Ming-e Jing, Yue Hao, JinFeng Zhang, Peijun Ma: Efficient parametric yield optimization of VLSI circuit by uniform design sampling method. Microelectronics Reliability 45(1): 155-162 (2005)
	2003
8		Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma: Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17
7		Daoguang Liu, Siliu Xu, Kaicheng Li, Jin Zhang, Rongkan Liu, Yukui Liu, Zhengfan Zhang, Gangyi Hu, Yue Hao: Growth and quality control of MBE-based SiGe-HBT for amplifier applications. Microelectronics Journal 34(5-8): 587-589 (2003)
	2002
6		Xiaohong Jiang, Yue Hao, Susumu Horiguchi: A new approach for critical area estimation in VLSI. Journal of Systems Architecture 47(10): 869-881 (2002)
5		Hongxia Liu, Yue Hao, Jiangang Zhu: A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs. Microelectronics Reliability 42(7): 1037-1044 (2002)
	2001
4		Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-
3		Hongxia Ren, Yue Hao: Study on the degradation induced by donor interface state in deep-sub-micron grooved-gate P-channel MOSFET's. Microelectronics Reliability 41(4): 597-604 (2001)
	2000
2		Xiaohong Jiang, Susumu Horiguchi, Yue Hao: Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. DFT 2000: 30-
1		Tianxu Zhao, Yue Hao, Yong-Chang Jiao: VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy. DFT 2000: 41-46

Coauthor Index

1	Taifeng Chen	[4]
2	Yiu-ming Cheung	[11] [12]
3	Xuchao Duan	[8]
4	Susumu Horiguchi	[2] [6]
5	Gangyi Hu	[7]
6	Xiaohong Jiang	[2] [6]
7	Licheng Jiao	[11] [12]
8	Yong-Chang Jiao	[1] [11] [12]
9	Ming-e Jing	[9] [13]
10	Kaicheng Li	[7]
11	Daoguang Liu	[7]
12	Hongxia Liu	[5]
13	Jiming Liu	[11] [12]
14	Rongkan Liu	[7]
15	Yukui Liu	[7]
16	Jianfeng Ma	[11] [12]
17	Peijun Ma	[4] [8] [9]
18	JinYu Ni	[14]
19	Hongxia Ren	[3]
20	Junping Wang	[10]
21	Yuping Wang	[11] [12]
22	Siliu Xu	[7]
23	Hujun Yin	[11] [12]
24	Xuan Zeng	[13]
25	Jin Zhang	[7]
26	JinCheng Zhang	[14]
27	JinFeng Zhang	[9] [14]
28	Zhengfan Zhang	[7]
29	Tianxu Zhao	[1] [4] [8]
30	Dian Zhou	[13]
31	Jiangang Zhu	[5]

Colors in the list of coauthors