 | 2009 |
|---|
| 7 |       | S. Saqib Khursheed,
Bashir M. Al-Hashimi,
Peter Harrod:
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing.
DATE 2009: 1349-1354 |
| 6 | | S. Saqib Khursheed,
Bashir M. Al-Hashimi,
Sudhakar M. Reddy,
Peter Harrod:
Diagnosis of Multiple-Voltage Design With Bridge Defect.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(3): 406-416 (2009) |
| 2008 |
|---|
| 5 | | S. Saqib Khursheed,
Urban Ingelsson,
Paul M. Rosinger,
Bashir M. Al-Hashimi,
Peter Harrod:
Bridging Fault Test Method With Adaptive Power Management Awareness.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1117-1127 (2008) |
| 2006 |
|---|
| 4 | | Noohul Basheer Zain Ali,
Mark Zwolinski,
Bashir M. Al-Hashimi,
Peter Harrod:
Dynamic Voltage Scaling Aware Delay Fault Testing.
European Test Symposium 2006: 15-20 |
| 2003 |
|---|
| 3 | | Michael G. Wahl,
Sudipta Bhawmik,
Kamran Zarrineh,
Pradipta Ghosh,
Scott Davidson,
Peter Harrod:
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data.
ITC 2003: 998-1007 |
| 1999 |
|---|
| 2 |  | Peter Harrod:
Testing reusable IP-a case study.
ITC 1999: 493-498 |
| 1 | | Robin Saxby,
Peter Harrod:
Test in the Emerging Intellectual Property Business.
IEEE Design & Test of Computers 16(1): 16-18 (1999) |
