Hamidreza Hashempour

	2009
15		Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi: Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. J. Electronic Testing 25(1): 55-66 (2009)
	2008
14		Hamidreza Hashempour, Fabrizio Lombardi: Device Model for Ballistic CNFETs Using the First Conducting Band. IEEE Design & Test of Computers 25(2): 178-186 (2008)
	2007
13		Hamidreza Hashempour, Fabrizio Lombardi: Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. DATE 2007: 841-846
	2006
12		Hamidreza Hashempour, Fabrizio Lombardi: A Novel Methodology for Functional Test Data Compression. DFT 2006: 128-135
	2005
11		Hamidreza Hashempour, Fabrizio Lombardi: Two dimensional reordering of functional test data for compression by ATE. ACM Great Lakes Symposium on VLSI 2005: 188-192
10		Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Enhancing error resilience for reliable compression of VLSI test data. ACM Great Lakes Symposium on VLSI 2005: 371-376
9		Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Evaluation of Error-Resilience for Reliable Compression of Test Data. DATE 2005: 1284-1289
8		Hamidreza Hashempour, Fabrizio Lombardi: Application of Arithmetic Coding to Compression of VLSI Test Data. IEEE Trans. Computers 54(9): 1166-1177 (2005)
	2004
7		Hamidreza Hashempour, Fabrizio Lombardi: Evaluation of heuristic techniques for test vector ordering. ACM Great Lakes Symposium on VLSI 2004: 96-99
6		Hamidreza Hashempour, Fabrizio Lombardi: Compression of VLSI Test Data by Arithmetic Coding. DFT 2004: 150-157
5		Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Error-Resilient Test Data Compression Using Tunstall Codes. DFT 2004: 316-323
	2003
4		Hamidreza Hashempour, Fabrizio Lombardi: ATE-Amenable Test Data Compression with No Cyclic Scan. DFT 2003: 151-158
3		Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936
	2002
2		Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194
1		Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park: A Test-Vector Generation Methodology for Crosstalk Noise Faults. DFT 2002: 40-50

Coauthor Index

1	André Ivanov	[15]
2	Faizal Karim	[15]
3	Farzin Karimi	[3]
4	Yong-Bin Kim	[1]
5	Fabrizio Lombardi	[2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15]
6	Fred J. Meyer	[2] [3]
7	Marco Ottavi	[15]
8	Nohpill Park	[1]
9	Luca Schiano	[5] [9] [10]
10	Vamsi Vankamamidi	[15]
11	Konrad Walus	[15]