T. Hashinaga

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2005

1 Y. Saito, T. Hashinaga, S. Nakajima: Effect of CVD-SiO₂ film on reliability of GaAs MESFET with Ti/Pt/Au gate metal. IEEE Transactions on Reliability 54(1): 79-82 (2005)

	2005
1		Y. Saito, T. Hashinaga, S. Nakajima: Effect of CVD-SiO₂ film on reliability of GaAs MESFET with Ti/Pt/Au gate metal. IEEE Transactions on Reliability 54(1): 79-82 (2005)

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