Luc Hebrard

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2007

1 Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58

	2007
1		Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58

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