Sybille Hellebrand

2008
27	EE	Uranmandakh Amgalan, Christian Hachmann, Sybille Hellebrand, Hans-Joachim Wunderlich: Signature Rollback - A Technique for Testing Robust Circuits. VTS 2008: 125-130
2007
26		Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. DDECS 2007: 185-190
25	EE	Sybille Hellebrand, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, Bernd Straube: A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. DFT 2007: 50-58
24	EE	Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. European Test Symposium 2007: 91-96
2006
23	EE	Bernd Becker, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich: DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). it - Information Technology 48(5): 304- (2006)
2004
22	EE	Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand: Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. ITC 2004: 926-935
2003
21	EE	Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand: A Hybrid Coding Strategy For Optimized Test Data Compression. ITC 2003: 451-459
2002
20	EE	Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik: Efficient Online and Offline Testing of Embedded DRAMs. IEEE Trans. Computers 51(7): 801-809 (2002)
19	EE	Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: A Mixed-Mode BIST Scheme Based on Folding Compression. J. Comput. Sci. Technol. 17(2): 203-212 (2002)
2001
18		Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: Two-dimensional test data compression for scan-based deterministic BIST. ITC 2001: 894-902
2000
17		Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang: A mixed mode BIST scheme based on reseeding of folding counters. ITC 2000: 778-784
1999
16	EE	Sybille Hellebrand, Hans-Joachim Wunderlich, Vyacheslav N. Yarmolik: Symmetric Transparent BIST for RAMs. DATE 1999: 702-707
15	EE	Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Hellebrand, Hans-Joachim Wunderlich: Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. EDCC 1999: 339-350
14	EE	Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik: Error Detecting Refreshment for Embedded DRAMs. VTS 1999: 384-390
1998
13	EE	Vyacheslav N. Yarmolik, Sybille Hellebrand, Hans-Joachim Wunderlich: Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. DATE 1998: 173-179
12	EE	Andre Hertwig, Sybille Hellebrand, Hans-Joachim Wunderlich: Fast Self-Recovering Controllers. VTS 1998: 296-302
11	EE	Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig: Synthesizing Fast, Online-Testable Control Units. IEEE Design & Test of Computers 15(4): 36-41 (1998)
1997
10	EE	Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, Malgorzata Marek-Sadowska: STARBIST: Scan Autocorrelated Random Pattern Generation. DAC 1997: 472-477
1996
9		Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig: Mixed-Mode BIST Using Embedded Processors. ITC 1996: 195-204
1995
8	EE	Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich: Pattern generation for a deterministic BIST scheme. ICCAD 1995: 88-94
7		Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)
1994
6		Sybille Hellebrand, Hans-Joachim Wunderlich: Synthesis of Self-Testable Controllers. EDAC-ETC-EUROASIC 1994: 580-585
5	EE	Sybille Hellebrand, Hans-Joachim Wunderlich: An efficient procedure for the synthesis of fast self-testable controller structures. ICCAD 1994: 110-116
1992
4		Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129
3	EE	Hans-Joachim Wunderlich, Sybille Hellebrand: The pseudoexhaustive test of sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 26-33 (1992)
1989
2		Sybille Hellebrand, Hans-Joachim Wunderlich: The Pseudo-Exhaustive Test of Sequential Circuits. ITC 1989: 19-27
1988
1		Sybille Hellebrand, Hans-Joachim Wunderlich: Automatisierung des Entwurfs vollständig testbarer Schaltungen. GI Jahrestagung (2) 1988: 145-159

Coauthor Index

1	Uranmandakh Amgalan	[27]
2	Bernd Becker	[23]
3	I. V. Bykov	[15]
4	Bernard Courtois	[4] [7]
5	Torsten Coym	[25]
6	Christian Hachmann	[27]
7	Andre Hertwig	[9] [11] [12]
8	Alexander A. Ivaniuk	[14] [20]
9	Yuri V. Klimets	[14] [20]
10	Huaguo Liang	[17] [18] [19]
11	Stefan Ludwig	[25]
12	Malgorzata Marek-Sadowska	[10]
13	Philipp Öhler	[24] [26]
14	Ilia Polian	[23]
15	Janusz Rajski	[4] [7] [10]
16	Birgit Reeb	[8]
17	Bernd Straube	[23] [25]
18	Steffen Tarnick	[4] [7] [8]
19	Christofer S. Tautermann	[21] [22]
20	Kun-Han Tsai	[10]
21	Srikanth Venkataraman	[7]
22	Hans-Joachim Wunderlich	[1] [2] [3] [5] [6] [8] [9] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [23] [24] [25] [26] [27]
23	Armin Würtenberger	[21] [22]
24	Vyacheslav N. Yarmolik	[13] [14] [15] [16] [20]
25	Christian G. Zoellin	[25]

Colors in the list of coauthors