 | 2009 |
| 20 |  | Tomasz Rudnicki,
Tomasz Garbolino,
Krzysztof Gucwa,
Andrzej Hlawiczka:
Effective BIST for crosstalk faults in interconnects.
DDECS 2009: 164-169 |
| 2008 |
| 19 |  | Andrzej Hlawiczka,
Krzysztof Gucwa,
Tomasz Garbolino,
Michal Kopec:
Interconnect Faults Identification and Localization Using Modified Ring LFSRs.
DDECS 2008: 247-250 |
| 2007 |
| 18 |  | Tomasz Garbolino,
Krzysztof Gucwa,
Michal Kopec,
Andrzej Hlawiczka:
Avoiding Crosstalk Influence on Interconnect Delay Fault Testing.
DDECS 2007: 149-152 |
| 17 |  | Tomasz Rudnicki,
Andrzej Hlawiczka:
Test Pattern Generator for Delay Faults.
DDECS 2007: 255-258 |
| 2006 |
| 16 |  | Tomasz Garbolino,
Michal Kopec,
Krzysztof Gucwa,
Andrzej Hlawiczka:
Detection, Localisation and Identification of Interconnection Faults Using MISR Compactor.
DDECS 2006: 230-231 |
| 15 |  | Michal Kopec,
Tomasz Garbolino,
Krzysztof Gucwa,
Andrzej Hlawiczka:
Test-per-Clock Detection, Localization and Identification of Interconnect Faults.
European Test Symposium 2006: 233-238 |
| 2004 |
| 14 |  | Ondrej Novák,
Zdenek Plíva,
Jiri Nosek,
Andrzej Hlawiczka,
Tomasz Garbolino,
Krzysztof Gucwa:
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor.
J. Electronic Testing 20(1): 109-122 (2004) |
| 2002 |
| 13 |  | Tomasz Garbolino,
Andrzej Hlawiczka:
Efficient test pattern generators based on specific cellular automata structures.
Microelectronics Reliability 42(6): 975-983 (2002) |
| 2000 |
| 12 |  | Andrzej Hlawiczka,
Michal Kopec:
Design and testing of fast and cost effective serial seeding TPGs based on one-dimensional linear hybrid cellular automata.
Asian Test Symposium 2000: 380-385 |
| 1999 |
| 11 |  | Tomasz Garbolino,
Andrzej Hlawiczka:
A New LFSR with D and T Flip-Flops as an Effective Test Pattern Generator for VLSI Circuits.
EDCC 1999: 321-338 |
| 1997 |
| 10 |  | Dariusz Badura,
Andrzej Hlawiczka:
Low Cost Bist for Edac Circuits.
Asian Test Symposium 1997: 410-415 |
| 9 |  | Andrzej Hlawiczka,
Michael Gössel,
Egor S. Sogomonyan:
A linear code-preserving signature analyzer COPMISR.
VTS 1997: 350-355 |
| 1996 |
| 8 |  | Andrzej Hlawiczka,
João Gabriel Silva,
Luca Simoncini:
Dependable Computing - EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 1996, Proceedings
Springer 1996 |
| 1994 |
| 7 |  | Andrzej Hlawiczka,
Jacek Binda:
Optimized Synthesis of Self-Testable Finite State Machines (FSM) Using BIST-PST Structures in Altera Structures.
FPL 1994: 120-122 |
| 1992 |
| 6 |  | Andrzej Hlawiczka:
Parallel Signature Analyzers Using Hybrid Design of Their Linear Feedbacks.
IEEE Trans. Computers 41(12): 1562-1571 (1992) |
| 1989 |
| 5 |  | Andrzej Hlawiczka:
Signature Analysis Testing with Bottom-Top Exclusive Or Type MISR.
Fehlertolerierende Rechensysteme 1989: 356-367 |
| 1987 |
| 4 |  | Andrzej Hlawiczka,
Dariusz Badura:
Universal Test Controller Chip for Board Self Test.
Fehlertolerierende Rechensysteme 1987: 165-175 |
| 1986 |
| 3 |  | Andrzej Hlawiczka:
Compression of Three-State Data Serial Streams by Means of a Parallel LFSR Signature Analyzer.
IEEE Trans. Computers 35(8): 732-741 (1986) |
| 1984 |
| 2 |  | Andrzej Hlawiczka:
Compression of multiple-valued data serial streams by means of parallel LFSR signature analyzer.
Fehlertolerierende Rechensysteme 1984: 404-416 |
| 1978 |
| 1 |  | Andrzej Hlawiczka:
Comments on `` Procedures for Eliminating Static and Dynamic-Hazards in Test Generation''.
IEEE Trans. Computers 27(2): 191 (1978) |