Yeoh Eng Hong

	1998
2		Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong: High volume microprocessor test escapes, an analysis of defects our tests are missing. ITC 1998: 25-34
	1997
1		Yeoh Eng Hong, Martin Tay Tiong We: The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices. ITC 1997: 304-309

Coauthor Index

1	Wayne M. Needham	[2]
2	Cheryl Prunty	[2]
3	Martin Tay Tiong We	[1]

Colors in the list of coauthors