Yoon Huh

	2005
1		Yoon Huh, Peter Bendix, Kyungjin Min, Jau-Wen Chen, Ravindra Narayan, Larry D. Johnson, Steven H. Voldman: ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. IWSOC 2005: 47-53

Coauthor Index

1	Peter Bendix	[1]
2	Jau-Wen Chen	[1]
3	Larry D. Johnson	[1]
4	Kyungjin Min	[1]
5	Ravindra Narayan	[1]
6	Steven H. Voldman	[1]