Douglas B. Hunt

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2003

2 Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectronics Reliability 43(1): 17-41 (2003)

2002

1 Guenther Benstetter, Michael W. Ruprecht, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. Microelectronics Reliability 42(3): 307-316 (2002)

	2003
2		Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectronics Reliability 43(1): 17-41 (2003)
	2002
1		Guenther Benstetter, Michael W. Ruprecht, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. Microelectronics Reliability 42(3): 307-316 (2002)

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