Chih-Hong Hwang

	2008
2		Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li: Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285
	2007
1		Yiming Li, Chih-Hong Hwang, Shao-Ming Yu: Numerical Simulation of Static Noise Margin for a Six-Transistor Static Random Access Memory Cell with 32nm Fin-Typed Field Effect Transistors. International Conference on Computational Science (4) 2007: 227-234

Coauthor Index

1	Tien-Yeh Li	[2]
2	Yiming Li	[1] [2]
3	Ta-Ching Yeh	[2]
4	Shao-Ming Yu	[1]