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DBLP keys1998
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKarim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska: Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100
1997
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHassan Ihs, Christian Dufaza: Test synthesis for DC test of switched-capacitors circuits. ED&TC 1997: 616
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChristian Dufaza, Hassan Ihs: Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits. VTS 1997: 252-260
1996
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChristian Dufaza, Hassan Ihs: A BIST-DFT technique for DC test of analog modules. J. Electronic Testing 9(1-2): 117-133 (1996)
1995
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHassan Ihs, Christian Dufaza: Tolerance DC bands of CMOS operational amplifier. Asian Test Symposium 1995: 140-

Coauthor Index

1Karim Arabi [5]
2Christian Dufaza [1] [2] [3] [4] [5]
3Bozena Kaminska [5]

Copyright © Mon Dec 21 17:44:35 2009 by Michael Ley (ley@uni-trier.de)