Nobuyuki Ikezawa

	2002
1		Shinya Ito, Hiroaki Namba, Tsuyoshi Hirata, Koichi Ando, Shin Koyama, Nobuyuki Ikezawa, Tatsuya Suzuki, Takehiro Saitoh, Tadahiko Horiuchi: Effect of mechanical stress induced by etch-stop nitride: impact on deep-submicron transistor performance. Microelectronics Reliability 42(2): 201-209 (2002)

Coauthor Index

1	Koichi Ando	[1]
2	Tsuyoshi Hirata	[1]
3	Tadahiko Horiuchi	[1]
4	Shinya Ito	[1]
5	Shin Koyama	[1]
6	Hiroaki Namba	[1]
7	Takehiro Saitoh	[1]
8	Tatsuya Suzuki	[1]