| 2009 | ||
|---|---|---|
| 47 | Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara: Fast false path identification based on functional unsensitizability using RTL information. ASP-DAC 2009: 660-665 | |
| 46 | Tatsushi Takeuchi, Koichiro Watanabe, Tomoo Inoue, Ken-ichi Okada: DiamondTheater: A System for Reproducing Theater and Supporting Creative Activities. HCI (4) 2009: 416-425 | |
| 2008 | ||
| 45 | Jonathan E. Leightner, Tomoo Inoue: Capturing climate's effect on pollution abatement with an improved solution to the omitted variables problem. European Journal of Operational Research 191(2): 540-557 (2008) | |
| 44 | Hideyuki Ichihara, Tomoyuki Saiki, Tomoo Inoue: An Architecture of Embedded Decompressor with Reconfigurability for Test Compression. IEICE Transactions 91-D(3): 713-719 (2008) | |
| 43 | Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara: A Self-Test of Dynamically Reconfigurable Processors with Test Frames. IEICE Transactions 91-D(3): 756-762 (2008) | |
| 2007 | ||
| 42 | Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara: Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. European Test Symposium 2007: 117-124 | |
| 41 | Ryoko Ishido, Keigo Kitahara, Tomoo Inoue, Ken-ichi Okada: Evaluation of Content Handling Methods for Tabletop Interface. HCI (2) 2007: 326-335 | |
| 40 | Tomoo Inoue, Naoko Yoshimura, Shigeo Sugimoto, Noriko Kando: Usability of a Content Construction System for Collaborative Learning. ICALT 2007: 833-835 | |
| 39 | Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara: TAM Design and Optimization for Transparency-Based SoC Test. VTS 2007: 381-388 | |
| 38 | Jonathan E. Leightner, Tomoo Inoue: Tackling the omitted variables problem without the strong assumptions of proxies. European Journal of Operational Research 178(3): 819-840 (2007) | |
| 37 | Hideyuki Ichihara, Toshihiro Ohara, Michihiro Shintani, Tomoo Inoue: A Variable-Length Coding Adjustable for Compressed Test Application. IEICE Transactions 90-D(8): 1235-1242 (2007) | |
| 2006 | ||
| 36 | Tomoyuki Saiki, Hideyuki Ichihara, Tomoo Inoue: A Reconfigurable Embedded Decompressor for Test Compression. DELTA 2006: 301-308 | |
| 35 | Tomoo Inoue, Keisuke Nakazawa, Yuri Yamamoto, Hiroshi Shigeno, Ken-ichi Okada: Use of human geographic recognition to reduce GPS error in mobile mapmaking learning. ICN/ICONS/MCL 2006: 222 | |
| 2005 | ||
| 34 | Michihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara, Tomoo Inoue: A Huffman-based coding with efficient test application. ASP-DAC 2005: 75-78 | |
| 33 | Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara: An Effective Design for Hierarchical Test Generation Based on Strong Testability. Asian Test Symposium 2005: 288-293 | |
| 32 | Tomoo Inoue, Yuri Yamamoto, Keisuke Nakazawa, Hiroshi Shigeno, Ken-ichi Okada: Proposal of a Map-Making System for Mobile Learning that Uses Subjective Geographic Recognition. ICALT 2005: 677-678 | |
| 31 | Yuta Maruyama, Keigo Kitahara, Tomoo Inoue, Hiroshi Shigeno, Ken-ichi Okada: Tangible Collaborative Learning Support System for Spatio-Temporal Contents. ICCE 2005: 799-802 | |
| 30 | Hideyuki Ichihara, Michihiro Shintani, Tomoo Inoue: Huffman-Based Test Response Coding. IEICE Transactions 88-D(1): 158-161 (2005) | |
| 2004 | ||
| 29 | Debesh Kumar Das, Tomoo Inoue, Susanta Chakraborty, Hideo Fujiwara: Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity. Asian Test Symposium 2004: 342-347 | |
| 28 | Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue: A Test Decompression Scheme for Variable-Length Coding. Asian Test Symposium 2004: 426-431 | |
| 2003 | ||
| 27 | Hideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue: Test Response Compression Based on Huffman Coding. Asian Test Symposium 2003: 446-451 | |
| 26 | Shuji Yamamoto, Seiki Hamada, Takeshi Johkoh, Tomoo Inoue, Yasuhiro Tamaki, Sachiko Murai, Noriyuki Tomiyama, Kaname Tomoda, Hironobu Nakamura: Tree-dimensional image processing for breast cancer using multislice CT. CARS 2003: 1312 | |
| 25 | Hideyuki Ichihara, Tomoo Inoue: Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG. DATE 2003: 11180-11181 | |
| 2002 | ||
| 24 | Tomoo Inoue, Tomokazu Miura, Akio Tamura, Hideo Fujiwara: A Scheduling Method in High-Level Synthesis for Acyclic Partial Scan Design. Asian Test Symposium 2002: 128-133 | |
| 23 | Hideyuki Ichihara, Tomoo Inoue: Generating Small Test Sets for Test Compression/Decompression Scheme Using Statistical Coding. DELTA 2002: 396-402 | |
| 22 | Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara: Test sequence compaction methods for acyclic sequential circuits using a time expansion model. Systems and Computers in Japan 33(10): 105-115 (2002) | |
| 2001 | ||
| 21 | Hideyuki Ichihara, Atsuhiro Ogawa, Tomoo Inoue, Akio Tamura: Dynamic Test Compression Using Statistical Coding. Asian Test Symposium 2001: 143- | |
| 2000 | ||
| 20 | Tomoo Inoue, Debesh Kumar Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara: Test Generation for Acyclic Sequential Circuits with Hold Registers. ICCAD 2000: 550-556 | |
| 1999 | ||
| 19 | Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara: Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. Asian Test Symposium 1999: 192- | |
| 18 | Tomoya Takasaki, Hideo Fujiwara, Tomoo Inoue: A High-Level Synthesis Approach to Partial Scan Design Based on Acyclic Structure. Asian Test Symposium 1999: 309-314 | |
| 17 | Tomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Effects of Video Expression in Videoconferencing. HICSS 1999 | |
| 1998 | ||
| 16 | Tomoya Takasaki, Tomoo Inoue, Hideo Fujiwara: Partial Scan Design Methods Based on Internally Balanced Structure. ASP-DAC 1998: 211-216 | |
| 15 | Tomoo Inoue, Toshinori Hosokawa, Takahiro Mihara, Hideo Fujiwara: An Optimal Time Expansion Model Based on Combinational ATPG for RT level Circuits. Asian Test Symposium 1998: 190-197 | |
| 14 | Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara: Universal Fault Diagnosis for Lookup Table FPGAs. IEEE Design & Test of Computers 15(1): 39-44 (1998) | |
| 13 | Hiroshi Youra, Tomoo Inoue, Toshimitsu Masuzawa, Hideo Fujiwara: On the synthesis of synchronizable finite state machines with partial scan. Systems and Computers in Japan 29(1): 53-62 (1998) | |
| 12 | Tomoya Takasaki, Tomoo Inoue, Hideo Fujiwara: Partial scan design methods based on internally balanced structure. Systems and Computers in Japan 29(10): 26-35 (1998) | |
| 1997 | ||
| 11 | Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247 | |
| 10 | Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara: On the Complexity of Universal Fault Diagnosis for Look-up Table FPGAs. Asian Test Symposium 1997: 276-281 | |
| 9 | Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara: Sequential Test Generation Based on Circuit Pseudo-Transformation. Asian Test Symposium 1997: 62-67 | |
| 8 | Tomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Integration of face-to-face and video-mediated meetings: HERMES. GROUP 1997: 405-414 | |
| 1996 | ||
| 7 | Tomoo Inoue, Toshimitsu Masuzawa, Hiroshi Youra, Hideo Fujiwara: An Approach To The Synthesis Of Synchronizable Finite State Machines With Partial Scan. Asian Test Symposium 1996: 130-135 | |
| 6 | Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74 | |
| 1995 | ||
| 5 | Tomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Learning from TV Programs: Application of TV Presentation to a Videoconferencing System. ACM Symposium on User Interface Software and Technology 1995: 147-154 | |
| 4 | Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto: Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265 | |
| 3 | Tomoo Inoue, Hironori Maeda, Hideo Fujiwara: A scheduling problem in test generation. VTS 1995: 344-349 | |
| 2 | Hideo Fujiwara, Tomoo Inoue: Optimal Granularity and Scheme of Parallel Test Generation in a Distributed System. IEEE Trans. Parallel Distrib. Syst. 6(7): 677-686 (1995) | |
| 1990 | ||
| 1 | Hideo Fujiwara, Tomoo Inoue: Optimal granularity of test generation in a distributed system. IEEE Trans. on CAD of Integrated Circuits and Systems 9(8): 885-892 (1990) | |