A. Irace

	2006
2		A. Irace, G. Breglio, P. Spirito, A. Bricconi, D. Raffo, L. Merlin: Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode. Microelectronics Reliability 46(9-11): 1784-1789 (2006)
	2005
1		A. Irace, G. Breglio, P. Spirito, Romeo Letor, Sebastiano Russo: Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectronics Reliability 45(9-11): 1706-1710 (2005)

Coauthor Index

1	G. Breglio	[1] [2]
2	A. Bricconi	[2]
3	Romeo Letor	[1]
4	L. Merlin	[2]
5	D. Raffo	[2]
6	Sebastiano Russo	[1]
7	P. Spirito	[1] [2]