| 2007 |
|---|
| 11 | EE | Kay Suenaga,
Rodrigo Picos,
Sebastià A. Bota,
Miquel Roca,
Eugeni Isern,
Eugenio García:
A Module for BiST of CMOS RF Receivers.
J. Electronic Testing 23(6): 605-612 (2007) |
| 2004 |
|---|
| 10 | EE | Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Sebstatià A. Bota,
Eugenio García:
On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.
IOLTS 2004: 179 |
| 2003 |
|---|
| 9 | EE | Rodrigo Picos,
Joan Font,
Eugeni Isern,
Miquel Roca,
Eugenio García:
A Configurable Built in Current Sensor for Mixed Signal Circuit Testing.
IOLTS 2003: 167 |
| 8 | EE | Eugeni Isern,
Miquel Roca,
Francesc Moll:
Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits.
PATMOS 2003: 481-490 |
| 7 | EE | Joan Font,
Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Eugeni García-Moreno:
A new BICS for CMOS operational amplifiers by using oscillation test techniques.
Microelectronics Journal 34(10): 919-926 (2003) |
| 6 | EE | Francesc Moll,
Miquel Roca,
Eugeni Isern:
Analysis of dissipation energy of switching digital CMOS gates with coupled outputs.
Microelectronics Journal 34(9): 833-842 (2003) |
| 2002 |
|---|
| 5 | EE | Joan Font,
J. Ginard,
Eugeni Isern,
Miquel Roca,
Jaume Segura,
Eugenio García:
A BICS for CMOS Opamps by Monitoring the Supply Current Peak.
IOLTW 2002: 94-98 |
| 1998 |
|---|
| 4 | EE | Antoni Ferré,
Eugeni Isern,
Josep Rius,
Rosa Rodríguez-Montañés,
Joan Figueras:
IDDQ testing: state of the art and future trends.
Integration 26(1-2): 167-196 (1998) |
| 1995 |
|---|
| 3 | EE | Eugeni Isern,
Joan Figueras:
IDDQ Test and Diagnosis of CMOS Circuits.
IEEE Design & Test of Computers 12(4): 60-67 (1995) |
| 1994 |
|---|
| 2 | | Eugeni Isern,
Joan Figueras:
Test of Bridging Faults in Scan-based Sequential Circuits.
EDAC-ETC-EUROASIC 1994: 366-370 |
| 1993 |
|---|
| 1 | | Eugeni Isern,
Joan Figueras:
Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits.
ITC 1993: 73-82 |
