Kenji Ishikawa

	1995
1		Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Kennosuke Fukami: A tool for measuring quality of test pattern for LSIs' functional design. ASP-DAC 1995

Coauthor Index

1	Takashi Aoki	[1]
2	Kennosuke Fukami	[1]
3	Tomoji Toriyama	[1]