Shigeru Ito

	2008
2		Satoshi Tayu, Shigeru Ito, Shuichi Ueno: On Fault Testing for Reversible Circuits. IEICE Transactions 91-D(12): 2770-2775 (2008)
	2007
1		Satoshi Tayu, Shigeru Ito, Shuichi Ueno: On the Fault Testing for Reversible Circuits. ISAAC 2007: 812-821

Coauthor Index

1	Satoshi Tayu	[1] [2]
2	Shuichi Ueno	[1] [2]