Hideo Iwama Coauthor index DBLP Vis pubzone.org

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DBLP keys1998
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSatoshi Tsuji, Katsuhiro Tsujimoto, Hideo Iwama: Application of cross-sectional transmission electron microscopy to thin-film-transistor failure analysis. IBM Journal of Research and Development 42(3): 509-516 (1998)

Coauthor Index

1Satoshi Tsuji [1]
2Katsuhiro Tsujimoto [1]

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