Peter Janssen

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1999

2 Bram Kruseman, Peter Janssen, Victor Zieren: Transient current testing of 0.25 /spl mu/m CMOS devices. ITC 1999: 47-56

1998

1 Manoj Sachdev, Peter Janssen, Victor Zieren: Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. ITC 1998: 204

	1999
2		Bram Kruseman, Peter Janssen, Victor Zieren: Transient current testing of 0.25 /spl mu/m CMOS devices. ITC 1999: 47-56
	1998
1		Manoj Sachdev, Peter Janssen, Victor Zieren: Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. ITC 1998: 204

Coauthor Index

1 Bram Kruseman [2]

2 Manoj Sachdev [1]

3 Victor Zieren [1] [2]