Jiri Jenícek

	2008
3		Jiri Jenícek: Efficient Test Pattern Compression Method Using Hard Fault Preferring. DSD 2008: 703-708
	2007
2		Jiri Jenícek, Ondrej Novák: Test Pattern Compression Based on Pattern Overlapping. DDECS 2007: 29-34
	2006
1		Ondrej Novák, Zdenek Plíva, Jiri Jenícek, Zbynek Mader, Michal Jarkovský: Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead. DFT 2006: 300-308

Coauthor Index

1	Michal Jarkovský	[1]
2	Zbynek Mader	[1]
3	Ondrej Novák	[1] [2]
4	Zdenek Plíva	[1]