Shuen-Lin Jeng

	2007
3		Min-Hsiung Hsieh, Shuen-Lin Jeng: Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. IEEE Transactions on Reliability 56(3): 369-380 (2007)
2		Shuen-Lin Jeng, Jye-Chyi Lu, Kaibo Wang: A Review of Reliability Research on Nanotechnology. IEEE Transactions on Reliability 56(3): 401-410 (2007)
	2005
1		Wen-Kui Chang, Shuen-Lin Jeng: Impartial evaluation in software reliability practice. Journal of Systems and Software 76(2): 99-110 (2005)

Coauthor Index

1	Wen-Kui Chang	[1]
2	Min-Hsiung Hsieh	[3]
3	Jye-Chyi Lu	[2]
4	Kaibo Wang	[2]

Colors in the list of coauthors