Le Jin

	2008
13		Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin: System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405
12		Liang Chen, Le Jin, Feng He, Hanwen Cheng, Lenan Wu: Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks. IEICE Transactions 91-B(10): 3069-3076 (2008)
	2007
11		Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310
	2006
10		Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger: A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006
9		Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger: Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006
	2005
8		Le Jin, Degang Chen, Randall L. Geiger: A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381
7		Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen: A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812
	2004
6		Chengming He, Le Jin, Degang Chen, Randall L. Geiger: Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484
5		Le Jin, Chengming He, Degang Chen, Randall L. Geiger: An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931
4		Le Jin, Chengming He, Degang Chen, Randall L. Geiger: Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935
	2003
3		Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger: Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540
2		Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227
1		Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger: BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003)

Coauthor Index

1	Degang Chen	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [13]
2	Liang Chen	[12]
3	Hanwen Cheng	[12]
4	Randall L. Geiger	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [13]
5	Chengming He	[4] [5] [6]
6	Feng He	[12]
7	Turker Kuyel	[1] [2] [3]
8	Wenbo Liu	[7]
9	Kumar L. Parthasarathy	[1] [2] [3]
10	Dana Price	[1] [3]
11	Lenan Wu	[12]
12	Hanqing Xing	[7] [9] [10] [13]

Colors in the list of coauthors