| 1996 | ||
|---|---|---|
| 2 | Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena: Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC 1996: 934 | |
| 1995 | ||
| 1 | Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam: Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor. ITC 1995: 157-166 | |