Dimitrios Kagaris

Dimitri Kagaris

2007
56	EE	Abhishek Pillai, Wei Zhang, Dimitrios Kagaris: Detecting VLIW Hard Errors Cost-Effectively through a Software-Based Approach. AINA Workshops (1) 2007: 811-815
55	EE	Snehal Udar, Dimitri Kagaris: LFSR Reseeding with Irreducible Polynomials. IOLTS 2007: 293-298
54	EE	Christopher Jenkins, Jayawant Kakade, Dimitri Kagaris: Cellular Automata with Large Channel Separations. ISCAS 2007: 1033-1036
53	EE	Dimitri Kagaris, Themistoklis Haniotakis: Transistor-Level Synthesis for Low-Power Applications. ISQED 2007: 607-612
52	EE	Dimitrios Kagaris, Themistoklis Haniotakis: A Methodology for Transistor-Efficient Supergate Design. IEEE Trans. VLSI Syst. 15(4): 488-492 (2007)
51	EE	Jayawant Kakade, Dimitrios Kagaris: Minimization of Linear Dependencies Through the Use of Phase Shifters. IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1877-1882 (2007)
2006
50	EE	Dimitris Nikolos, Dimitrios Kagaris, S. Gidaros: Diophantine-Equation Based Arithmetic Test Set Embedding. IOLTS 2006: 193-194
49	EE	Jayawant Kakade, Dimitrios Kagaris: Phase shifts and linear dependencies. ISCAS 2006
48	EE	Dimitri Kagaris, Themistoklis Haniotakis: Transistor-Level Optimization of Supergates. ISQED 2006: 682-690
47	EE	Dimitri Kagaris: A similarity transform for linear finite state machines. Discrete Applied Mathematics 154(11): 1570-1577 (2006)
46	EE	Dimitri Kagaris, Spyros Tragoudas, Sherin Kuriakose: InTeRail: A Test Architecture for Core-Based SOCs. IEEE Trans. Computers 55(2): 137-149 (2006)
45	EE	Dimitrios Kagaris, P. Karpodinis, Dimitris Nikolos: On Obtaining Maximum-Length Sequences for Accumulator-Based Serial TPG. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2578-2586 (2006)
44	EE	A. Mehta, Dimitrios Kagaris, R. Viswanathan: Throughput performance of an adaptive ARQ scheme in Rayleigh fading channels. IEEE Transactions on Wireless Communications 5(1): 12-15 (2006)
43	EE	Dimitri Kagaris, Rajesh Aakuthota, Anila Verma: Maximum sequence test pattern generators with irreducible characteristic polynomials. Microprocessors and Microsystems 30(2): 117-123 (2006)
2005
42	EE	Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir: A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage. IOLTS 2005: 221-226
41	EE	Dimitrios Kagaris: A unified method for phase shifter computation. ACM Trans. Design Autom. Electr. Syst. 10(1): 157-167 (2005)
40	EE	Dimitri Kagaris: Phase Shifter Merging. J. Electronic Testing 21(2): 161-168 (2005)
2004
39	EE	P. Karpodinis, Dimitri Kagaris, Dimitris Nikolos: Accumulator based Test-per-Scan BIST. IOLTS 2004: 193-198
2003
38	EE	Dimitri Kagaris, Spyros Tragoudas: InTeRail: Using Existing and Extra Interconnects to Test Core-Based SOCs. IOLTS 2003: 219-224
37	EE	Maciej Bellos, Dimitri Kagaris, Dimitris Nikolos: Low Power Test Set Embedding Based on Phase Shifters. ISVLSI 2003: 155-160
36		Maciej Bellos, Xrysovalantis Kavousianos, Dimitris Nikolos, Dimitri Kagaris: DV-TSE: Difference Vector Based Test Set Embedding. VLSI-SOC 2003: 343-
35	EE	Dimitri Kagaris: Built-In TPG with Designed Phaseshifts. VTS 2003: 365-370
34	EE	Dimitri Kagaris: Multiple-Seed TPG Structures. IEEE Trans. Computers 52(12): 1633-1639 (2003)
33	EE	Dimitri Kagaris: On minimum delay clustering without replication. Integration 36(1-2): 27-39 (2003)
2002
32	EE	Maciej Bellos, Dimitrios Kagaris, Dimitris Nikolos: Test Set Embedding Based on Phase Shifters. EDCC 2002: 90-101
31	EE	Dimitri Kagaris: Built-in Generation of m -Sequences with Irreducible Characteristic Polynomials. IOLTW 2002: 158-
30	EE	Dimitrios Kagaris: Linear dependencies in extended LFSMs. IEEE Trans. on CAD of Integrated Circuits and Systems 21(7): 852-859 (2002)
29	EE	Dimitrios Kagaris, Spyros Tragoudas: On the nonenumerative path delay fault simulation problem. IEEE Trans. on CAD of Integrated Circuits and Systems 21(9): 1095-1101 (2002)
2001
28	EE	Dimitri Kagaris, Spyros Tragoudas: Using a WLFSR to Embed Test Pattern Pairs in Minimum Time. IOLTW 2001: 75-79
27	EE	Dimitrios Kagaris, Spyros Tragoudas: Von Neumann hybrid cellular automata for generating deterministic test sequences. ACM Trans. Design Autom. Electr. Syst. 6(3): 308-321 (2001)
26		Dimitrios Kagaris, Spyros Tragoudas: Computational analysis of counter-based schemes for VLSI test pattern generation. Discrete Applied Mathematics 110(2-3): 227-250 (2001)
2000
25	EE	Dimitrios Kagaris, Spyros Tragoudas: Pseudoexhaustive TPG with a Provably Low Number of LFSR Seeds. ICCD 2000: 42-47
24	EE	Dimitri Kagaris, Spyros Tragoudas, Amitava Majumdar: Test-set partitioning for multi-weighted random LFSRs. Integration 30(1): 65-75 (2000)
1999
23	EE	Dimitrios Kagaris, Spyros Tragoudas: LFSR/SR Pseudo-Exhaustive TPG in Fewer Test Cycles. DFT 1999: 130-138
22	EE	Dimitrios Kagaris, Spyros Tragoudas: Embedded cores using built-in mechanisms. ISCAS (1) 1999: 23-26
21	EE	Dimitrios Kagaris, Spyros Tragoudas: On the design of optimal counter-based schemes for test set embedding. IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 219-230 (1999)
20	EE	Dimitri Kagaris, Spyros Tragoudas: Maximum weighted independent sets on transitive graphs and applications1. Integration 27(1): 77-86 (1999)
19	EE	Dimitrios Kagaris, Grammati E. Pantziou, Spyros Tragoudas, Christos D. Zaroliagis: Transmissions in a network with capacities and delays. Networks 33(3): 167-174 (1999)
1998
18	EE	Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar: On-Chip Test Embedding for Multi-Weighted Random LFSRs. DFT 1998: 135-
1997
17	EE	Dimitrios Kagaris, Spyros Tragoudas: Maximum independent sets on transitive graphs and their applications in testing and CAD. ICCAD 1997: 736-740
16		Dimitrios Kagaris, Spyros Tragoudas, Dimitrios Karayiannis: Nonenumerative Path Delay Fault Coverage Estimation with Optimal Algorithms. ICCD 1997: 366-371
15	EE	Dimitrios Kagaris, Spyros Tragoudas, Dimitrios Karayiannis: Improved nonenumerative path-delay fault-coverage estimation based on optimal polynomial-time algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 16(3): 309-315 (1997)
1996
14	EE	Dimitrios Kagaris, Spyros Tragoudas: A multiseed counter TPG with performance guarantee. ICCD 1996: 34-39
13	EE	Dimitrios Kagaris, Spyros Tragoudas: Generating deterministic unordered test patterns with counters. VTS 1996: 374-379
12	EE	Dimitrios Kagaris, Spyros Tragoudas: A fast algorithm for minimizing FPGA combinational and sequential modules. ACM Trans. Design Autom. Electr. Syst. 1(3): 341-351 (1996)
11		Dimitrios Kagaris, Spyros Tragoudas: Retiming-Based Partial Scan. IEEE Trans. Computers 45(1): 75-87 (1996)
10		Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar: On the Use of Counters for Reproducing Deterministic Test Sets. IEEE Trans. Computers 45(12): 1405-1419 (1996)
1995
9	EE	Dimitrios Kagaris, Spyros Tragoudas, Grammati E. Pantziou, Christos D. Zaroliagis: Quickest paths: parallelization and dynamization . HICSS (2) 1995: 39-40
8		Dimitrios Kagaris, Spyros Tragoudas, Grammati E. Pantziou, Christos D. Zaroliagis: On the Computation of Fast Data Transmissions in Networks with Capacities and Delays. WADS 1995: 291-302
7	EE	Dimitrios Kagaris, Spyros Tragoudas, Dinesh Bhatia: Pseudo-exhaustive built-in TPG for sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 14(9): 1160-1171 (1995)
1994
6		Dimitrios Kagaris, Spyros Tragoudas: A Class of Good Characteristics Polynomials for LFSR Test Pattern Generators. ICCD 1994: 292-295
5	EE	Dimitrios Kagaris, Fillia Makedon, Spyros Tragoudas: A method for pseudo-exhaustive test pattern generation. IEEE Trans. on CAD of Integrated Circuits and Systems 13(9): 1170-1178 (1994)
1993
4	EE	Dimitrios Kagaris, Spyros Tragoudas: Partial Scan with Retiming. DAC 1993: 249-254
3		Dimitrios Kagaris, Spyros Tragoudas, Dinesh Bhatia: Pseudoexhaustive BIST for Sequential Circuits. ICCD 1993: 523-527
2	EE	Dimitrios Kagaris, Spyros Tragoudas: Cost-effective LFSR synthesis for optimal pseudoexhaustive BIST test sets. IEEE Trans. VLSI Syst. 1(4): 526-536 (1993)
1992
1		Dimitrios Kagaris, Fillia Makedon, Spyros Tragoudas: On Minimizing Hardware Overhead for Pseudoexhaustive Circuit Testability. ICCD 1992: 358-364

Coauthor Index

1	Rajesh Aakuthota	[43]
2	Maciej Bellos	[32] [36] [37]
3	Dinesh Bhatia	[3] [7]
4	Rohit Gambhir	[42]
5	S. Gidaros	[50]
6	Themistoklis Haniotakis (Th. Haniotakis)	[48] [52] [53]
7	Christopher Jenkins	[54]
8	Jayawant Kakade	[49] [51] [54]
9	Dimitrios Karayiannis	[15] [16]
10	P. Karpodinis	[39] [45]
11	Xrysovalantis Kavousianos	[36]
12	Sherin Kuriakose	[46]
13	Amitava Majumdar	[10] [18] [24]
14	Fillia Makedon	[1] [5]
15	A. Mehta	[44]
16	Dimitris Nikolos	[32] [36] [37] [39] [45] [50]
17	Grammati E. Pantziou	[8] [9] [19]
18	Abhishek Pillai	[56]
19	Dhiraj K. Pradhan	[42]
20	Spyros Tragoudas	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [38] [46]
21	Snehal Udar	[55]
22	Anila Verma	[43]
23	R. Viswanathan	[44]
24	Christos D. Zaroliagis	[8] [9] [19]
25	Wei Zhang	[56]

Colors in the list of coauthors