| 1999 | ||
|---|---|---|
| 1 | Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani: Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. ITC 1999: 301-310 | |
| 1 | Keiichi Higeta | [1] |
| 2 | Toshiaki Kawamura | [1] |
| 3 | Masaki Kohno | [1] |
| 4 | Shigeru Nakahara | [1] |