In Man Kang

	2004
1		Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee: Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. Microelectronics Reliability 44(1): 47-51 (2004)

Coauthor Index

1	Jung Chak Ahn	[1]
2	Hyuck In Kwon	[1]
3	Jong Duk Lee	[1]
4	Yong Hee Lee	[1]
5	Byung-Gook Park	[1]
6	Sang Sik Park	[1]