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 | 2008 | |
|---|---|---|
| 1 |      | Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang: A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520 |
| 1 | Sungho Kang | [1] |
| 2 | Gunbae Kim | [1] |
| 3 | Byungheon Kwak | [1] |
| 4 | Hwacheol Lee | [1] |
| 5 | Jinseok Lee | [1] |
| 6 | Jonghyoung Lim | [1] |
| 7 | Incheol Nam | [1] |
| 8 | Sangki Son | [1] |
| 9 | Jongsoo Yim | [1] |