Sungho Kang

	2009
51		YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang: Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time. IEICE Transactions 92-D(7): 1462-1465 (2009)
	2008
50		Sunghoon Chun, Taejin Kim, Sungho Kang: A new low energy BIST using a statistical code. ASP-DAC 2008: 647-652
49		Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang: A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520
48		Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang: An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS 2008: 73-78
47		Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Jin-Ho Ahn, Sungho Kang: Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor Using Dynamic Voltage Scaling Efficiency Metric. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 2088-2092 (2008)
46		Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang: A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. IEICE Transactions 91-C(10): 1713-1716 (2008)
45		Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang: A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Transactions 91-C(4): 670-672 (2008)
44		Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang: A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. IEICE Transactions 91-D(4): 1185-1188 (2008)
43		DongSup Song, Jin-Ho Ahn, Tae-Jin Kim, Sungho Kang: MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs. IEICE Transactions 91-D(4): 1197-1200 (2008)
42		Hong-Sik Kim, Sungho Kang, Michael S. Hsiao: A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electronic Testing 24(4): 365-378 (2008)
41		Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang: An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electronic Testing 24(6): 591-595 (2008)
	2007
40		Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang: A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Transactions 90-C(11): 2161-2163 (2007)
39		Sunghoon Chun, YongJoon Kim, Sungho Kang: MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electronic Testing 23(4): 357-362 (2007)
	2006
38		Jin-Ho Ahn, Hyunjin Kim, Byung In Moon, Sungho Kang: System on a Chip Implementation of Social Insect Behavior for Adaptive Network Routing. ICIC (2) 2006: 530-535
37		Jin-Ho Ahn, Sungho Kang: SoC Test Scheduling Algorithm Using ACO-Based Rectangle Packing. ICIC (2) 2006: 655-660
36		Hyuntae Park, Byung In Moon, Sungho Kang: Improved Reinforcement Computing to Implement AntNet-Based Routing Using General NPs for Ubiquitous Environments. ICUCT 2006: 242-251
35		Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang: MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. VLSI Syst. 14(6): 649-654 (2006)
34		Hong-Sik Kim, Sungho Kang: Increasing encoding efficiency of LFSR reseeding-based test compression. IEEE Trans. on CAD of Integrated Circuits and Systems 25(5): 913-917 (2006)
33		DongSup Song, Sungho Kang: A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets. IEICE Transactions 89-D(1): 354-357 (2006)
32		Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang: An Efficient Dictionary Organization for Maximum Diagnosis. J. Electronic Testing 22(1): 37-48 (2006)
	2005
31		DongSup Song, Sungho Kang: Increasing Embedding Probabilities of RPRPs in RIN Based BIST. Asia-Pacific Computer Systems Architecture Conference 2005: 600-613
30		Jin-Ho Ahn, Byung In Moon, Sungho Kang: A Practical Test Scheduling Using Network-Based TAM in Network on Chip Architecture. Asia-Pacific Computer Systems Architecture Conference 2005: 614-624
29		Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang: A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium 2005: 230-235
28		Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang: A New Low Power Test Pattern Generator for BIST Architecture. IEICE Transactions 88-C(10): 2037-2038 (2005)
27		Junseok Han, DongSup Song, Hagbae Kim, Youngyong Kim, Sungho Kang: An Effective Built-In Self-Test for Chargepump PLL. IEICE Transactions 88-C(8): 1731-1733 (2005)
	2004
26		Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang: RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium 2004: 242-247
25		Jae Seuk Oh, Sung-il Bae, Jin-Ho Ahn, Sungho Kang: Route Reinforcement for Efficient QoS Routing Based on Ant Algorithm. ICOIN 2004: 342-349
24		Byung In Moon, Hongil Yoon, Ilgun Yun, Sungho Kang: An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications. PDCAT 2004: 539-544
23		YongJoon Kim, Hyun-Don Kim, Sungho Kang: A new maximal diagnosis algorithm for interconnect test. IEEE Trans. VLSI Syst. 12(5): 532-537 (2004)
	2003
22		YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang: A New Maximal Diagnosis Algorithm for Bus-structured Systems. ITC 2003: 349-357
21		Hong-Sik Kim, YongJoon Kim, Sungho Kang: Test-decompression mechanism using a variable-length multiple-polynomial LFSR. IEEE Trans. VLSI Syst. 11(4): 687-690 (2003)
20		Sungho Kang, Stephen A. Szygenda: Accurate Logic Simulation by Overcoming the Unknown Value Propagation Problem. Simulation 79(2): 59-68 (2003)
	2002
19		Sung-il Bae, Daesik Seo, Gilyoung Kang, Sungho Kang: A New Survival Architecture for Network Processors. AISA 2002: 1-10
18		Sangmin Bae, DongSup Song, Jihye Kim, Sungho Kang: An Efficient On-Line Monitoring BIST for Remote Service System. AISA 2002: 205-214
17		Sungchul Yoon, Sangwook Kim, Jae Seuk Oh, Sungho Kang: A New DSP Architecture for Correcting Errors Using Viterbi Algorithm. AISA 2002: 95-102
16		Hong-Sik Kim, Sungho Kang: DPSC SRAM Transparent Test Algorithm. Asian Test Symposium 2002: 145-150
	2001
15		Hong-Sik Kim, Jin-kyue Lee, Sungho Kang: A Heuristic for Multiple Weight Set Generation. ICCD 2001: 513-514
14		Hong-Sik Kim, Jin-kyue Lee, Sungho Kang: A new multiple weight set calculation algorithm. ITC 2001: 878-884
13		Song Chong, Sangho Lee, Sungho Kang: A simple, scalable, and stable explicit rate allocation algorithm for MAX-MIN flow control with minimum rate guarantee. IEEE/ACM Trans. Netw. 9(3): 322-335 (2001)
	1999
12		Jongchul Shin, Hyunjin Kim, Sungho Kang: At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. DATE 1999: 473-
11		Hangkyu Lee, Sungho Kang: A New Weight Set Generation Algorithm for Weighted Random Pattern Generation. ICCD 1999: 160-165
10		Hyunjin Kim, Jongchul Shin, Sungho Kang: An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. ICCD 1999: 328-329
	1997
9		Yong Seok Kang, Jong Cheol Lee, Sungho Kang: Built-in Self Test for Contect Addressable Memories. ICCD 1997: 48-53
	1996
8		Jae-Wook Lee, Sungho Kang: Efficient Simulation Model Generation Using Automatic Programming Techniques. Winter Simulation Conference 1996: 708-713
	1995
7		Youngmin Hur, Stephen A. Szygenda, E. Scott Fehr, Granville E. Ott, Sungho Kang: Massively Parallel Array Processor for Logic, Fault, and Design Error Simulation. HPCA 1995: 340-347
	1994
6		Sungho Kang, Wai-On Law, Bill Underwood: Path-Delay Fault Simulation for a Standard Scan Design Methodology. ICCD 1994: 359-362
5		Bill Underwood, Wai-On Law, Sungho Kang, Haluk Konuk: Fastpath: A Path-Delay Test Generator for Standard Scan Designs. ITC 1994: 154-163
4		Sungho Kang, Stephen A. Szygenda: Design Validation: Comparing Theoretical and Empirical Results of Design Error Modeling. IEEE Design & Test of Computers 11(1): 18-26 (1994)
3		Sungho Kang, Stephen A. Szygenda: The simulation automation system (SAS); concepts, implementation, and results. IEEE Trans. VLSI Syst. 2(1): 89-99 (1994)
	1993
2		Sungho Kang, Stephen A. Szygenda: Automatic VHDL Model Generation System. CHDL 1993: 353-360
	1992
1		Sungho Kang, Stephen A. Szygenda: Modeling and Simulation of Design Errors. ICCD 1992: 443-446

Coauthor Index

1	Jin-Ho Ahn	[25] [26] [30] [37] [38] [43] [47]
2	Sangmin Bae	[18]
3	Sung-il Bae	[19] [25]
4	Song Chong	[13]
5	Sunghoon Chun	[22] [26] [32] [35] [39] [41] [48] [50]
6	E. Scott Fehr	[7]
7	Junseok Han	[27]
8	Hyejeong Hong	[47]
9	Michael S. Hsiao	[42]
10	Youngmin Hur	[7]
11	Jung-Been Im	[26] [35]
12	Gilyoung Kang	[19]
13	Sangseok Kang	[49]
14	Yong Seok Kang	[9]
15	Geunbae Kim	[26]
16	Gunbae Kim	[49]
17	Hagbae Kim	[27]
18	Hong-Sik Kim	[14] [15] [16] [21] [32] [34] [42] [47]
19	Hyun-Don Kim	[23]
20	Hyunjin Kim	[10] [12] [38] [47]
21	Incheol Kim	[28] [40] [44] [45] [46]
22	Jihye Kim	[18]
23	Kicheol Kim	[28] [40] [44] [45] [46]
24	Sangwook Kim	[17] [32]
25	Tae-Jin Kim	[43]
26	Taejin Kim	[48] [50]
27	YongJoon Kim	[21] [22] [23] [35] [39] [41] [48] [51]
28	Youbean Kim	[29] [40] [44] [45] [46]
29	Youngyong Kim	[27]
30	Haluk Konuk	[5]
31	Byungheon Kwak	[49]
32	Wai-On Law	[5] [6]
33	Hangkyu Lee	[11]
34	Hwacheol Lee	[49]
35	Jae-Wook Lee	[8]
36	Jin-kyue Lee	[14] [15]
37	Jinseok Lee	[49]
38	Jong Cheol Lee	[9]
39	Sangho Lee	[13]
40	Yong Lee	[29]
41	Jonghyoung Lim	[49]
42	Byung In Moon	[24] [30] [36] [38]
43	Incheol Nam	[49]
44	Jae Seuk Oh	[17] [25]
45	Granville E. Ott	[7]
46	Eunsei Park	[51]
47	Hyuntae Park	[36]
48	Jaeseok Park	[51]
49	Daesik Seo	[19]
50	Jongchul Shin	[10] [12]
51	YongSeung Shin	[22]
52	HyeonUk Son	[40] [45]
53	Hyunwook Son	[44]
54	Sangki Son	[49]
55	DongSub Song	[22] [28]
56	DongSup Song	[18] [27] [31] [33] [43]
57	Stephen A. Szygenda	[1] [2] [3] [4] [7] [20]
58	Bill Underwood	[5] [6]
59	Myung-Hoon Yang	[29] [41] [51]
60	Jongsoo Yim	[49]
61	Hongil Yoon	[24]
62	Sungchul Yoon	[17]
63	Ilgun Yun	[24]

Colors in the list of coauthors