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 | 1996 | |
|---|---|---|
| 1 |      | Kazuo Kawakubo, Koji Tanaka, Hiromi Hiraishi: Formal Verification Of Self-Testing Properties Of Combinational Circuits. Asian Test Symposium 1996: 119-122 |
| 1 | Hiromi Hiraishi | [1] |
| 2 | Koji Tanaka | [1] |