Hans G. Kerkhoff

	2008
39		Hans G. Kerkhoff, Jarkko J. M. Huijts: Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications. DELTA 2008: 38-44
38		Oscar Kuiken, Xiao Zhang, Hans G. Kerkhoff: Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications. DFT 2008: 45-53
	2007
37		Hans G. Kerkhoff: Testing Microelectronic Biofluidic Systems. IEEE Design & Test of Computers 24(1): 72-82 (2007)
	2006
36		Hans G. Kerkhoff, X. Zhang, R. W. Barber, D. R. Emerson: Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. DELTA 2006: 177-182
	2005
35		Hans G. Kerkhoff: The test search for true mixed-signal cores. Microelectronics Journal 36(12): 1103-1111 (2005)
	2004
34		Hans G. Kerkhoff, Arun A. Joseph: Testability Issues in Superconductor Electronic. DELTA 2004: 9-14
33		Octavian Petre, Hans G. Kerkhoff: Scan Test Strategy for Asynchronous-Synchronous Interfaces. J. Electronic Testing 20(6): 639-645 (2004)
	2003
32		Arun A. Joseph, Hans G. Kerkhoff: Towards Structural Testing of Superconductor Electronics. ITC 2003: 1182-1191
31		Hans G. Kerkhoff, Mustafa Acar: Testable Design and Testing of Micro-Electro-Fluidic Arrays. VTS 2003: 403-409
30		Nur Engin, Hans G. Kerkhoff: Fast Fault Simulation for Nonlinear Analog Circuits. IEEE Design & Test of Computers 20(2): 40-47 (2003)
29		Frank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff: Synchronous Full-Scan for Asynchronous Handshake Circuits. J. Electronic Testing 19(4): 397-406 (2003)
28		Hans G. Kerkhoff, Bozena Kaminska: Analog and mixed signal test techniques for SoCs. Microelectronics Journal 34(10): 887-888 (2003)
27		M. Stancic, Hans G. Kerkhoff: Testability-analysis driven test-generation of analogue cores. Microelectronics Journal 34(10): 913-917 (2003)
	2002
26		Octavian Petre, Hans G. Kerkhoff: On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications. Asian Test Symposium 2002: 122-
25		Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans: Testable Design and Testing of High-Speed Superconductor Microelectronics. DELTA 2002: 8-12
24		Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff: Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813
23		M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff: A New Test Generation Approach for Embedded Analogue Cores in SoC. ITC 2002: 861-869
22		Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim: SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450
21		V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures. J. Electronic Testing 18(2): 203-212 (2002)
	2001
20		Octavian Petre, Hans G. Kerkhoff: Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. IOLTW 2001: 95-99
19		Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff: Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC 2001: 1098-1107
18		David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Modeling a Verification Test System for Mixed-Signal Circuits. IEEE Design & Test of Computers 18(1): 63-71 (2001)
17		Hans G. Kerkhoff, Han Speek, M. Shashani, Manoj Sachdev: Design for Delay Testability in High-Speed Digital ICs. J. Electronic Testing 17(3-4): 225-231 (2001)
16		Hans G. Kerkhoff, Hans P. A. Hendriks: Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems. J. Electronic Testing 17(5): 427-437 (2001)
	2000
15		V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Design and Test Space Exploration of Transport-Triggered Architectures. DATE 2000: 146-
14		Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev: A Low-Speed BIST Framework for High-Performance Circuit Testing. VTS 2000: 349-358
	1999
13		Manoj Sachdev, Hans G. Kerkhoff: Configurations for IDDQ-Testable PLAs. IEEE Design & Test of Computers 16(2): 58-65 (1999)
12		Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electronic Testing 14(1-2): 125-131 (1999)
11		Richard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev: Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. J. Electronic Testing 14(1-2): 67-74 (1999)
10		Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek: Integrated Design and Test of Mixed-Signal Circuits. J. Electronic Testing 14(1-2): 75-83 (1999)
	1998
9		Hans G. Kerkhoff: Microsystem Testing: Challenge or Common Knowledge?. Asian Test Symposium 1998: 510-511
	1997
8		Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff: Smart sensor system application: an integrated compass. ED&TC 1997: 195-199
7		V. Kaal, Hans G. Kerkhoff: Compact structural test generation for analog macros. ED&TC 1997: 581-587
	1990
6		Jon T. Butler, Hans G. Kerkhoff, Siep Onneweer: A Comparative Analysis of Multiplexer Techniques for the Minimization of Function Cost Using the Costtable Approach. ISMVL 1990: 286-291
5		R. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg: Designing and Implementing an Architecture with Boundary Scan. IEEE Design & Test of Computers 7(1): 9-19 (1990)
4		Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff: Testability analysis of analog systems. IEEE Trans. on CAD of Integrated Circuits and Systems 9(6): 573-583 (1990)
	1988
3		Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff: TASTE: A Tool for Analog System Testability Evaluation. ITC 1988: 829-838
2		Jon T. Butler, Hans G. Kerkhoff: Multiple-Valued CCD Circuits. IEEE Computer 21(4): 58-69 (1988)
	1981
1		Hans G. Kerkhoff, Marius L. Tervoert: Multiple-Valued Logic Charge-Coupled Devices. IEEE Trans. Computers 30(9): 644-652 (1981)

Coauthor Index

1	Mustafa Acar	[31]
2	R. W. Barber	[36]
3	H. Bederr	[22]
4	Frank te Beest	[24] [29]
5	David San Segundo Bello	[18]
6	Kees van Berkel	[24] [29]
7	R. D. (Shawn) Blanton (Ronald D. Blanton)	[22]
8	Jon T. Butler	[2] [6]
9	G. Diemel	[8]
10	D. R. Emerson	[36]
11	Nur Engin	[10] [30]
12	L. Fang	[23]
13	Chris Feige	[12]
14	Gertjan J. Hemink	[3] [4]
15	Hans P. A. Hendriks	[16]
16	Sander Heuvelmans	[25]
17	Jarkko J. M. Huijts	[39]
18	Arun A. Joseph	[25] [32] [34]
19	V. Kaal	[7]
20	Linda A. Kamas	[19]
21	Bozena Kaminska	[28]
22	Ajay Khoche	[19]
23	H. J. Klim	[22]
24	A. Kloppenburg	[5]
25	Oscar Kuiken	[38]
26	Berend W. Meijer	[3] [4]
27	Salvador Mir	[22]
28	Siep Onneweer	[6]
29	Ad M. G. Peeters	[24] [29]
30	Octavian Petre	[20] [26] [33]
31	Jan Ten Pierick	[12]
32	R. P. van Riessen	[5]
33	Jochen Rivoir	[19]
34	Richard Rosing	[11]
35	Manoj Sachdev	[11] [13] [14] [17]
36	Mansour Shashaani	[14]
37	M. Shashani	[17]
38	Han Speek	[10] [17]
39	M. Stancic	[23] [27]
40	Ronald J. W. T. Tangelder	[8] [10] [11] [12] [15] [18] [21]
41	Marius L. Tervoert	[1]
42	R. M. W. Tijink	[23]
43	Marc Verra	[24]
44	Erik H. Volkerink	[19]
45	M. H. H. Weusthof	[23]
46	Clemens Wouters	[12]
47	X. Zhang	[36]
48	Xiao Zhang	[38]
49	V. A. Zivkovic	[15] [21]

Colors in the list of coauthors