| 2009 | ||
|---|---|---|
| 32 | Jörg Henkel, Ali Keshavarzi, Naehyuck Chang, Tahir Ghani: Proceedings of the 9008 International Symposium on Low Power Electronics and Design, 2009, San Fancisco, CA, USA, August 19-21, 2009 ACM 2009 | |
| 2008 | ||
| 31 | Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle: Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008 ACM 2008 | |
| 2007 | ||
| 30 | Diana Marculescu, Anand Raghunathan, Ali Keshavarzi, Vijaykrishnan Narayanan: Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007 ACM 2007 | |
| 29 | José Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs CoRR abs/0710.4759: (2007) | |
| 2006 | ||
| 28 | Sebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura: Impact of Thermal Gradients on Clock Skew and Testing. IEEE Design & Test of Computers 23(5): 414-424 (2006) | |
| 2005 | ||
| 27 | José Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs. DATE 2005: 206-211 | |
| 26 | James Tschanz, Siva Narendra, Ali Keshavarzi, Vivek De: Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power. ISCAS (1) 2005: 9-12 | |
| 25 | Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De: Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED 2005: 26-29 | |
| 24 | Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay: Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF. VLSI Design 2005: 12-13 | |
| 2004 | ||
| 23 | Arman Vassighi, Ali Keshavarzi, Siva Narendra, Gerhard Schrom, Yibin Ye, Seri Lee, Greg Chrysler, Manoj Sachdev, Vivek De: Design optimizations for microprocessors at low temperature. DAC 2004: 2-5 | |
| 22 | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ITC 2004: 1108-1117 | |
| 21 | Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi: Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. ITC 2004: 1276-1284 | |
| 20 | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: DFT for Delay Fault Testing of High-Performance Digital Circuits. IEEE Design & Test of Computers 21(3): 248-258 (2004) | |
| 2003 | ||
| 19 | Shekhar Borkar, Tanay Karnik, Siva Narendra, James Tschanz, Ali Keshavarzi, Vivek De: Parameter variations and impact on circuits and microarchitecture. DAC 2003: 338-342 | |
| 18 | Charles F. Hawkins, Ali Keshavarzi, Jaume Segura: A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT 2003: 267- | |
| 17 | Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi: Thermal Management of High Performance Microprocessors. DFT 2003: 313-319 | |
| 16 | B. Alorda, B. Bloechel, Ali Keshavarzi, Jaume Segura: CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. ITC 2003: 719-726 | |
| 15 | Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins: Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC 2003: 95-104 | |
| 14 | Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De: Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. IEEE Trans. VLSI Syst. 11(5): 863-870 (2003) | |
| 2002 | ||
| 13 | Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi: Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT 2002: 12-19 | |
| 12 | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. ITC 2002: 1130-1139 | |
| 11 | Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins: Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC 2002: 90-99 | |
| 10 | Jaume Segura, Vivek De, Ali Keshavarzi: Challenges in Nanometric Technology Scaling: Trends and Projections. VTS 2002: 447-448 | |
| 9 | Zhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy: IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions. IEEE Design & Test of Computers 19(2): 24-33 (2002) | |
| 8 | Ali Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins: Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Design & Test of Computers 19(5): 36-43 (2002) | |
| 7 | Fatih Hamzaoglu, Yibin Ye, Ali Keshavarzi, Kevin Zhang, Siva Narendra, Shekhar Borkar, Mircea R. Stan, Vivek De: Analysis of dual-VT SRAM cells with full-swing single-ended bit line sensing for on-chip cache. IEEE Trans. VLSI Syst. 10(2): 91-95 (2002) | |
| 2001 | ||
| 6 | Ali Keshavarzi, Sean Ma, Siva Narendra, B. Bloechel, K. Mistry, T. Ghani, Shekhar Borkar, Vivek De: Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs. ISLPED 2001: 207-212 | |
| 5 | Kaushik Roy, Ali Keshavarzi: Design and Test of Low Voltage CMOS Circuits. ISQED 2001: 7 | |
| 2000 | ||
| 4 | Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, K. Soumyanath, Vivek De: Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC 2000: 1051-1059 | |
| 3 | Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins: Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. VLSI Syst. 8(6): 717-723 (2000) | |
| 1999 | ||
| 2 | Ali Keshavarzi, Siva Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De: Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED 1999: 252-254 | |
| 1997 | ||
| 1 | Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins: Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC 1997: 146-155 | |