Ali Keshavarzi Coauthor index DBLP Vis pubzone.org

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31no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle: Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008 ACM 2008
2007
30no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDiana Marculescu, Anand Raghunathan, Ali Keshavarzi, Vijaykrishnan Narayanan: Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007 ACM 2007
29Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJosé Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs CoRR abs/0710.4759: (2007)
2006
28Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura: Impact of Thermal Gradients on Clock Skew and Testing. IEEE Design & Test of Computers 23(5): 414-424 (2006)
2005
27Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJosé Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs. DATE 2005: 206-211
26Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJames Tschanz, Siva Narendra, Ali Keshavarzi, Vivek De: Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power. ISCAS (1) 2005: 9-12
25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De: Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED 2005: 26-29
24Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay: Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF. VLSI Design 2005: 12-13
2004
23Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLArman Vassighi, Ali Keshavarzi, Siva Narendra, Gerhard Schrom, Yibin Ye, Seri Lee, Greg Chrysler, Manoj Sachdev, Vivek De: Design optimizations for microprocessors at low temperature. DAC 2004: 2-5
22Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ITC 2004: 1108-1117
21Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi: Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. ITC 2004: 1276-1284
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: DFT for Delay Fault Testing of High-Performance Digital Circuits. IEEE Design & Test of Computers 21(3): 248-258 (2004)
2003
19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShekhar Borkar, Tanay Karnik, Siva Narendra, James Tschanz, Ali Keshavarzi, Vivek De: Parameter variations and impact on circuits and microarchitecture. DAC 2003: 338-342
18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCharles F. Hawkins, Ali Keshavarzi, Jaume Segura: A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT 2003: 267-
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLArman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi: Thermal Management of High Performance Microprocessors. DFT 2003: 313-319
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLB. Alorda, B. Bloechel, Ali Keshavarzi, Jaume Segura: CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. ITC 2003: 719-726
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLOleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins: Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC 2003: 95-104
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De: Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. IEEE Trans. VLSI Syst. 11(5): 863-870 (2003)
2002
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLArman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi: Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT 2002: 12-19
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi: A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. ITC 2002: 1130-1139
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins: Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC 2002: 90-99
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJaume Segura, Vivek De, Ali Keshavarzi: Challenges in Nanometric Technology Scaling: Trends and Projections. VTS 2002: 447-448
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy: IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions. IEEE Design & Test of Computers 19(2): 24-33 (2002)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins: Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Design & Test of Computers 19(5): 36-43 (2002)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFatih Hamzaoglu, Yibin Ye, Ali Keshavarzi, Kevin Zhang, Siva Narendra, Shekhar Borkar, Mircea R. Stan, Vivek De: Analysis of dual-VT SRAM cells with full-swing single-ended bit line sensing for on-chip cache. IEEE Trans. VLSI Syst. 10(2): 91-95 (2002)
2001
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, Sean Ma, Siva Narendra, B. Bloechel, K. Mistry, T. Ghani, Shekhar Borkar, Vivek De: Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs. ISLPED 2001: 207-212
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKaushik Roy, Ali Keshavarzi: Design and Test of Low Voltage CMOS Circuits. ISQED 2001: 7
2000
4no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, K. Soumyanath, Vivek De: Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC 2000: 1051-1059
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, Kaushik Roy, Charles F. Hawkins: Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. VLSI Syst. 8(6): 717-723 (2000)
1999
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, Siva Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De: Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED 1999: 252-254
1997
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Keshavarzi, Kaushik Roy, Charles F. Hawkins: Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC 1997: 146-155

Coauthor Index

1B. Alorda [16]
2Carol de Benito [28]
3B. Bloechel [6] [16]
4Shekhar Y. Borkar (Shekhar Borkar) [2] [6] [7] [19]
5Sebastià A. Bota [21] [27] [28] [29]
6Keith A. Bowman [25]
7John Brews [25]
8Vicens Canals [27] [29]
9Abhijit Chatterjee [24]
10Bhaskar Chatterjee [12] [20] [22]
11Zhanping Chen [9]
12Greg Chrysler [23]
13W. Robert Daasch [8]
14Vivek De [2] [4] [6] [7] [8] [10] [14] [19] [23] [25] [26]
15Steven G. Duvall [25]
16T. Ghani [6]
17Nagib Hakim [25]
18Fatih Hamzaoglu [7]
19Charles F. Hawkins [1] [2] [3] [4] [8] [11] [14] [15] [18]
20Jörg Henkel [31]
21Tanay Karnik [19]
22Seri Lee [23]
23Tom Linton [25]
24Sean Ma [6] [25]
25Diana Marculescu [30]
26K. Mistry [6]
27Siddhartha Mukhopadhyay [24]
28Siva Narendra [2] [6] [7] [8] [19] [23] [26]
29Vojin G. Oklobdzija [31]
30Barry M. Pangrle [31]
31Amit Patra [24]
32Anand Raghunathan [30]
33C. P. Ravikumar [31]
34M. Rosales [21]
35José Luis Rosselló [21] [27] [28] [29]
36Kaushik Roy [1] [2] [3] [4] [5] [8] [9] [14]
37Manoj Sachdev [4] [8] [12] [13] [15] [17] [20] [22] [23]
38Gerhard Schrom [23] [25]
39Jaume Segura [10] [11] [16] [18] [21] [27] [28] [29]
40Oleg Semenov [13] [15] [17]
41Jerry M. Soden [11]
42K. Soumyanath [4]
43Mircea R. Stan [7]
44Stephen Tang [25]
45James Tschanz [8] [19] [26]
46Sunit Tyagi [25]
47Arman Vassighi [13] [15] [17] [23]
48Narayanan Vijaykrishnan (Vijaykrishnan Narayanan) [30] [31]
49Liqiong Wei [9]
50Yibin Ye [7] [23]
51Kevin Zhang [7] [25]

Copyright © Mon Nov 9 16:52:13 2009 by Michael Ley (ley@uni-trier.de)