Shuji Kikuchi

	1995
2		Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino: A Gate-Array-Based 666MHz VLSI Test System. ITC 1995: 451-458
	1989
1		Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi: A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566

Coauthor Index

1	Yoshihiko Hayashi	[1] [2]
2	Masahiko Kaneko	[2]
3	Takashi Matsumoto	[1] [2]
4	Jun Saitou	[2]
5	Takashi Suga	[2]
6	Ryuichi Takagi	[1]
7	Ryozou Yoshino	[1] [2]