Byung-gi Kim

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1997

1 Byung-gi Kim, Hoon Chang, Jung Wan Cho: Methodology for ensuring high reliability of VLSI systems. Journal of Systems Architecture 43(1-5): 111-117 (1997)

	1997
1		Byung-gi Kim, Hoon Chang, Jung Wan Cho: Methodology for ensuring high reliability of VLSI systems. Journal of Systems Architecture 43(1-5): 111-117 (1997)

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