 | 2009 |
|---|
| 4 |       | Pilsung Kang,
Hyoungjoo Lee,
Sungzoon Cho,
Dongil Kim,
Jinwoo Park,
Chan-Kyoo Park,
Seungyong Doh:
A virtual metrology system for semiconductor manufacturing.
Expert Syst. Appl. 36(10): 12554-12561 (2009) |
| 2008 |
|---|
| 3 | | Dongil Kim,
Sungzoon Cho:
Bootstrap Based Pattern Selection for Support Vector Regression.
PAKDD 2008: 608-615 |
| 2 | | Dongil Kim,
Hyoungjoo Lee,
Sungzoon Cho:
Response modeling with support vector regression.
Expert Syst. Appl. 34(2): 1102-1108 (2008) |
| 2006 |
|---|
| 1 | | Dongil Kim,
Sungzoon Cho:
epsilon-Tube Based Pattern Selection for Support Vector Machines.
PAKDD 2006: 215-224 |
