Kinam Kim

	2003
3		Kinam Kim, Yoon J. Song: Integration technology for ferroelectric memory devices. Microelectronics Reliability 43(3): 385-398 (2003)
	2002
2		Yongseok Ahn, Sanghyun Lee, Gwanhyeob Koh, Taeyoung Chung, Kinam Kim: The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon. Microelectronics Reliability 42(3): 349-354 (2002)
1		Kinam Kim, Gi-Tae Jeong, Chan-Woong Chun, Sam-Jin Hwang: DRAM reliability. Microelectronics Reliability 42(4-5): 543-553 (2002)

Coauthor Index

1	Yongseok Ahn	[2]
2	Chan-Woong Chun	[1]
3	Taeyoung Chung	[2]
4	Sam-Jin Hwang	[1]
5	Gi-Tae Jeong	[1]
6	Gwanhyeob Koh	[2]
7	Sanghyun Lee	[2]
8	Yoon J. Song	[3]

Colors in the list of coauthors