Seong-Joon Kim

	2008
2		Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang: Degradation Analysis of Nano-Contamination in Plasma Display Panels. IEEE Transactions on Reliability 57(2): 222-229 (2008)
	2007
1		Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam: Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. IEEE Transactions on Reliability 56(3): 392-400 (2007)

Coauthor Index

1	Suk Joo Bae	[1] [2]
2	Chang Wook Kang	[2]
3	Man Soo Kim	[2]
4	Way Kuo	[1]
5	Paul H. Kvam	[1]
6	Bae Jin Lee	[2]