Tae-Hyeon Kim

	1999
1		Tae-Hyeon Kim, Tai-Hoon Cho, Young Shik Moon, Sung-Han Park: Visual inspection system for the classification of solder joints. Pattern Recognition 32(4): 565-575 (1999)

Coauthor Index

1	Tai-Hoon Cho	[1]
2	Young Shik Moon	[1]
3	Sung-Han Park	[1]