Von-Kyoung Kim

	1999
5		Von-Kyoung Kim, Tom Chen, Mick Tegethoff: Fault Coverage Estimation for Early Stage of VLSI Design. Great Lakes Symposium on VLSI 1999: 105-108
4		Von-Kyoung Kim, Tom Chen: Assessing Defect Coverage of Memory Testing Algorithms. Great Lakes Symposium on VLSI 1999: 340-
3		Von-Kyoung Kim, Tom Chen: On comparing functional fault coverage and defect coverage for memory testing. IEEE Trans. on CAD of Integrated Circuits and Systems 18(11): 1676-1683 (1999)
	1997
2		Von-Kyoung Kim, Tom Chen, Mick Tegethoff: ASIC Manufacturing Test Cost Prediction at Early Design Stage. ITC 1997: 356-361
	1996
1		Von-Kyoung Kim, Mick Tegethoff, Tom Chen: ASIC Yield Estimation at Early Design Cycle. ITC 1996: 590-594

Coauthor Index

1	Tom Chen	[1] [2] [3] [4] [5]
2	Mick Tegethoff	[1] [2] [5]