 | 2009 |
|---|
| 8 |       | YongJoon Kim,
Myung-Hoon Yang,
Jaeseok Park,
Eunsei Park,
Sungho Kang:
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time.
IEICE Transactions 92-D(7): 1462-1465 (2009) |
| 2008 |
|---|
| 7 | | Sunghoon Chun,
Taejin Kim,
YongJoon Kim,
Sungho Kang:
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.
VTS 2008: 73-78 |
| 6 | | Myung-Hoon Yang,
YongJoon Kim,
Sunghoon Chun,
Sungho Kang:
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.
J. Electronic Testing 24(6): 591-595 (2008) |
| 2007 |
|---|
| 5 | | Sunghoon Chun,
YongJoon Kim,
Sungho Kang:
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.
J. Electronic Testing 23(4): 357-362 (2007) |
| 2006 |
|---|
| 4 | | Sunghoon Chun,
YongJoon Kim,
Jung-Been Im,
Sungho Kang:
MICRO: a new hybrid test data compression/decompression scheme.
IEEE Trans. VLSI Syst. 14(6): 649-654 (2006) |
| 2004 |
|---|
| 3 |  | YongJoon Kim,
Hyun-Don Kim,
Sungho Kang:
A new maximal diagnosis algorithm for interconnect test.
IEEE Trans. VLSI Syst. 12(5): 532-537 (2004) |
| 2003 |
|---|
| 2 | | YongJoon Kim,
DongSub Song,
YongSeung Shin,
Sunghoon Chun,
Sungho Kang:
A New Maximal Diagnosis Algorithm for Bus-structured Systems.
ITC 2003: 349-357 |
| 1 | | Hong-Sik Kim,
YongJoon Kim,
Sungho Kang:
Test-decompression mechanism using a variable-length multiple-polynomial LFSR.
IEEE Trans. VLSI Syst. 11(4): 687-690 (2003) |
