 | 2008 |
|---|
| 93 |       | Xiaoqing Wen,
Kohei Miyase,
Tatsuya Suzuki,
Seiji Kajihara,
Laung-Terng Wang,
Kewal K. Saluja,
Kozo Kinoshita:
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.
J. Electronic Testing 24(4): 379-391 (2008) |
| 2007 |
|---|
| 92 | | Xiaoqing Wen,
Seiji Kajihara,
Kohei Miyase,
Tatsuya Suzuki,
Kewal K. Saluja,
Laung-Terng Wang,
Kozo Kinoshita:
A Novel ATPG Method for Capture Power Reduction during Scan Testing.
IEICE Transactions 90-D(9): 1398-1405 (2007) |
| 91 | | Hideyuki Ichihara,
Toshimasa Kuchii,
Masaaki Yamadate,
Hideaki Sakaguchi,
Hiroshi Uemura,
Kozo Kinoshita:
A statistical error model for image sensors and its testing.
Systems and Computers in Japan 38(11): 1-11 (2007) |
| 2006 |
|---|
| 90 | | Xiaoqing Wen,
Seiji Kajihara,
Kohei Miyase,
Tatsuya Suzuki,
Kewal K. Saluja,
Laung-Terng Wang,
Khader S. Abdel-Hafez,
Kozo Kinoshita:
A New ATPG Method for Efficient Capture Power Reduction During Scan Testing.
VTS 2006: 58-65 |
| 89 | | Xiaoqing Wen,
Seiji Kajihara,
Kohei Miyase,
Yuta Yamato,
Kewal K. Saluja,
Laung-Terng Wang,
Kozo Kinoshita:
A Per-Test Fault Diagnosis Method Based on the X-Fault Model.
IEICE Transactions 89-D(11): 2756-2765 (2006) |
| 88 | | Xiaoqing Wen,
Yoshiyuki Yamashita,
Seiji Kajihara,
Laung-Terng Wang,
Kewal K. Saluja,
Kozo Kinoshita:
A New Method for Low-Capture-Power Test Generation for Scan Testing.
IEICE Transactions 89-D(5): 1679-1686 (2006) |
| 2005 |
|---|
| 87 | | Xiaoqing Wen,
Yoshiyuki Yamashita,
Seiji Kajihara,
Laung-Terng Wang,
Kewal K. Saluja,
Kozo Kinoshita:
On Low-Capture-Power Test Generation for Scan Testing.
VTS 2005: 265-270 |
| 86 | | Xiaoqing Wen,
Seiji Kajihara,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies.
IEICE Transactions 88-D(4): 703-710 (2005) |
| 85 | | Xiaoqing Wen,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Fault Diagnosis of Physical Defects Using Unknown Behavior Model.
J. Comput. Sci. Technol. 20(2): 187-194 (2005) |
| 84 | | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees.
J. Electronic Testing 21(6): 613-620 (2005) |
| 2004 |
|---|
| 83 | | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure.
DELTA 2004: 269-274 |
| 82 | | Xiaoqing Wen,
Tokiharu Miyoshi,
Seiji Kajihara,
Laung-Terng Wang,
Kewal K. Saluja,
Kozo Kinoshita:
On per-test fault diagnosis using the X-fault model.
ICCAD 2004: 633-640 |
| 2003 |
|---|
| 81 | | Xiaoqing Wen,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Fault Diagnosis for Physical Defects of Unknown Behaviors.
Asian Test Symposium 2003: 236-241 |
| 80 | | Masaki Hashizume,
Teppei Takeda,
Hiroyuki Yotsuyanagi,
Takeomi Tamesada,
Yukiya Miura,
Kozo Kinoshita:
A BIST Circuit for IDDQ Tests.
Asian Test Symposium 2003: 390-395 |
| 79 | | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
Reducing Scan Shifts Using Folding Scan Trees.
Asian Test Symposium 2003: 6-11 |
| 78 | | Hideyuki Ichihara,
Kozo Kinoshita,
Koji Isodono,
Shigeki Nishikawa:
Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.
VLSI Design 2003: 329-334 |
| 2002 |
|---|
| 77 | | Kazuya Shimizu,
Noriyoshi Itazaki,
Kozo Kinoshita:
Crosstalk Fault Reduction and Simulation for Clock-Delayed Domino Circuits.
Asian Test Symposium 2002: 176-181 |
| 76 | | Kazuya Shimizu,
Masaya Takamura,
Takanori Shirai,
Noriyoshi Itazaki,
Kozo Kinoshita:
Fault Simulation Method for Crosstalk Faults in Clock-Delayed Domino CMOS Circuits.
DELTA 2002: 92-98 |
| 75 | | Sudhakar M. Reddy,
Irith Pomeranz,
Huaxing Tang,
Seiji Kajihara,
Kozo Kinoshita:
On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout.
ITC 2002: 83-89 |
| 74 | | Kozo Kinoshita:
Foreword.
J. Electronic Testing 18(1): 13 (2002) |
| 73 | | Kazuya Shimizu,
Noriyoshi Itazaki,
Kozo Kinoshita:
Built-in Self-Test for crosstalk faults in a digital VLSI.
Systems and Computers in Japan 33(13): 35-47 (2002) |
| 2001 |
|---|
| 72 | | Teppei Takeda,
Masaki Hashizume,
Masahiro Ichimiya,
Hiroyuki Yotsuyanagi,
Yukiya Miura,
Kozo Kinoshita:
IDDQ Sensing Technique for High Speed IDDQ Testing.
Asian Test Symposium 2001: 111-116 |
| 71 | | Kazuya Shimizu,
Noriyoshi Itazaki,
Kozo Kinoshita:
Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits.
Asian Test Symposium 2001: 469 |
| 2000 |
|---|
| 70 | | Yoshinobu Higami,
Yuzo Takamatsu,
Kewal K. Saluja,
Kozo Kinoshita:
Fault models and test generation for IDDQ testing: embedded tutorial.
ASP-DAC 2000: 509-514 |
| 69 | | Arabi Keshk,
Yukiya Miura,
Kozo Kinoshita:
Simulation of resistive bridging fault to minimize the presence of intermediate voltage and oscillation in CMOS circuits.
Asian Test Symposium 2000: 120-124 |
| 68 | | Yoshinobu Higami,
Yuzo Takamatsu,
Kozo Kinoshita:
Test sequence compaction for sequential circuits with reset states.
Asian Test Symposium 2000: 165-170 |
| 67 | | Toshiyuki Maeda,
Kozo Kinoshita:
Memory reduction of I/sub DDQ/ test compaction for internal and external bridging faults.
Asian Test Symposium 2000: 350-355 |
| 66 | | Yann Antonioli,
Tsuneo Inufushi,
Shigeki Nishikawa,
Kozo Kinoshita:
A high-speed IDDQ sensor implementation.
Asian Test Symposium 2000: 356-361 |
| 65 |  | Toshiyuki Maeda,
Kozo Kinoshita:
Precise test generation for resistive bridging faults of CMOS combinational circuits.
ITC 2000: 510-519 |
| 64 | | Hideyuki Ichihara,
Kozo Kinoshita,
Irith Pomeranz,
Sudhakar M. Reddy:
Test Transformation to Improve Compaction by Statistical Encoding.
VLSI Design 2000: 294-299 |
| 63 | | Toshiyuki Maeda,
Kozo Kinoshita:
Compaction of IDDQ Test Sequence Using Reassignment Method.
J. Electronic Testing 16(3): 243-249 (2000) |
| 62 | | Yoshinobu Higami,
Yuzo Takamatsu,
Kewal K. Saluja,
Kozo Kinoshita:
Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits.
J. Electronic Testing 16(5): 443-451 (2000) |
| 61 | | Yoshinobu Higami,
Kewal K. Saluja,
Yuzo Takamatsu,
Kozo Kinoshita:
Static test compaction for IDDQ testing of bridging faults in sequential circuits.
Systems and Computers in Japan 31(11): 41-50 (2000) |
| 1999 |
|---|
| 60 | | Arabi Keshk,
Kozo Kinoshita,
Yukiya Miura:
Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits.
Asian Test Symposium 1999: 121-126 |
| 59 | | Yoshinobu Higami,
Yuzo Takamatsu,
Kewal K. Saluja,
Kozo Kinoshita:
Fault Simulation Techniques to Reduce IDDQ Measurement Vectors for Sequential Circuits.
Asian Test Symposium 1999: 141-146 |
| 58 | | Hideyuki Ichihara,
Kozo Kinoshita,
Seiji Kajihara:
On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits.
Asian Test Symposium 1999: 147-152 |
| 57 | | Arabi Keshk,
Kozo Kinoshita,
Yukiya Miura:
IDDQ Current Dependency on Test Vectors and Bridging Resistance.
Asian Test Symposium 1999: 158-163 |
| 56 | | Hideyuki Ichihara,
Kozo Kinoshita,
Seiji Kajihara:
On Test Generation with A Limited Number of Tests.
Great Lakes Symposium on VLSI 1999: 12-15 |
| 55 | | Yoshinobu Higami,
Kewal K. Saluja,
Kozo Kinoshita:
Efficient Techniques for Reducing IDDQ Observation Time for Sequential Circuits.
VLSI Design 1999: 72-77 |
| 1998 |
|---|
| 54 | | Xiaoqing Wen,
Tooru Honzawa,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Design for Diagnosability of CMOS Circuits.
Asian Test Symposium 1998: 144-149 |
| 53 | | Noriyoshi Itazaki,
Fumiro Matsuki,
Yasuyuki Matsumoto,
Kozo Kinoshita:
Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA.
Asian Test Symposium 1998: 272-277 |
| 52 | | Yoshinobu Higami,
Kewal K. Saluja,
Kozo Kinoshita:
Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits.
Asian Test Symposium 1998: 312-317 |
| 51 | | Masaki Hashizume,
Yukiya Miura,
Masahiro Ichimiya,
Takeomi Tamesada,
Kozo Kinoshita:
A High-Speed IDDQ Sensor for Low-Voltage ICs.
Asian Test Symposium 1998: 327- |
| 50 | | Hideyuki Ichihara,
Seiji Kajihara,
Kozo Kinoshita:
An Efficient Procedure for Obtaining Implication Relations and Its Application to Redundancy Identification.
Asian Test Symposium 1998: 58-63 |
| 49 | | Hiroyuki Yotsuyanagi,
Kozo Kinoshita:
Undetectable Fault Removal of Sequential Circuits Based on Unreachable States.
VTS 1998: 176-183 |
| 1997 |
|---|
| 48 | | Noriyoshi Itazaki,
Yasutaka Idomoto,
Kozo Kinoshita:
An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits.
Asian Test Symposium 1997: 22- |
| 47 | | Hideyuki Ichihara,
Kozo Kinoshita:
On Acceleration of Logic Circuits Optimization Using Implication Relations.
Asian Test Symposium 1997: 222-227 |
| 46 | | Yoshinobu Higami,
Kozo Kinoshita:
Design of partially parallel scan chain.
ED&TC 1997: 626 |
| 45 | | Seiji Kajihara,
Kozo Kinoshita,
Irith Pomeranz,
Sudhakar M. Reddy:
A Method for Identifying Robust Dependent and Functionally Unsensitizable Paths.
VLSI Design 1997: 82-87 |
| 44 | | Hiroyuki Yotsuyanagi,
Seiji Kajihara,
Kozo Kinoshita:
Synthesis of Sequential Circuits by Redundancy Removal and Retiming.
J. Electronic Testing 11(1): 81-92 (1997) |
| 43 | | Xiaoqing Wen,
Hideo Tamamoto,
Kozo Kinoshita:
IDDQ test vector selection for transistor short fault testing.
Systems and Computers in Japan 28(5): 11-21 (1997) |
| 42 | | Atsushi Yoshikawa,
Seiji Kajihara,
Masahiro Numa,
Kozo Kinoshita:
A diagnosis method for single logic design errors in gate-level combinational circuits.
Systems and Computers in Japan 28(6): 30-39 (1997) |
| 41 | | Hideyuki Ichihara,
Kozo Kinoshita,
Seiji Kajihara:
On invariant implication relations for removing partial circuits.
Systems and Computers in Japan 28(7): 39-47 (1997) |
| 1996 |
|---|
| 40 | | Yoshinobu Higami,
Seiji Kajihara,
Kozo Kinoshita:
Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique.
Asian Test Symposium 1996: 94-99 |
| 39 | | Noriyoshi Itazaki,
Yasutaka Idomoto,
Kozo Kinoshita:
A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits.
FTCS 1996: 38-43 |
| 1995 |
|---|
| 38 | | Yoshinobu Higami,
Seiji Kajihara,
Kozo Kinoshita:
Test sequence compaction by reduced scan shift and retiming.
Asian Test Symposium 1995: 169-175 |
| 37 | | Hiroaki Ueda,
Kozo Kinoshita:
Low power design and its testability.
Asian Test Symposium 1995: 361-366 |
| 36 | | Xiaoqing Wen,
Hideo Tamamoto,
Kozo Kinoshita:
Transistor leakage fault location with ZDDQ measurement.
Asian Test Symposium 1995: 51-57 |
| 35 | | Hiroyuki Yotsuyanagi,
Seiji Kajihara,
Kozo Kinoshita:
Synthesis for Testability by Sequential Redundancy Removal Using Retiming.
FTCS 1995: 33-40 |
| 34 | | Hiroyuki Yotsuyanagi,
Seiji Kajihara,
Kozo Kinoshita:
Resynthesis for sequential circuits designed with a specified initial state.
VTS 1995: 152-157 |
| 33 | | Seiji Kajihara,
Irith Pomeranz,
Kozo Kinoshita,
Sudhakar M. Reddy:
Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(12): 1496-1504 (1995) |
| 32 | | Yoshinobu Higami,
Seiji Kajihara,
Kozo Kinoshita:
Partial scan design and test sequence generation based on reduced scan shift method.
J. Electronic Testing 7(1-2): 115-124 (1995) |
| 1994 |
|---|
| 31 | | Yukiya Miura,
Sachio Naito,
Kozo Kinoshita:
A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of Current Testing Using the Upper Limit and the Lower Limit.
ISCAS 1994: 77-80 |
| 30 | | Yoshinobu Higami,
Seiji Kajihara,
Kozo Kinoshita:
Reduced Scan Shift: A New Testing Method for Sequential Circuit.
ITC 1994: 624-630 |
| 29 | | Antonio Rubio,
Noriyoshi Itazaki,
Xiaole Xu,
Kozo Kinoshita:
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 387-395 (1994) |
| 1993 |
|---|
| 28 | | Seiji Kajihara,
Irith Pomeranz,
Kozo Kinoshita,
Sudhakar M. Reddy:
Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits.
DAC 1993: 102-106 |
| 27 | | Seiji Kajihara,
Tetsuji Sumioka,
Kozo Kinoshita:
Test generation for multiple faults based on parallel vector pair analysis.
ICCAD 1993: 436-439 |
| 1992 |
|---|
| 26 | | Seiji Kajihara,
Haruko Shiba,
Kozo Kinoshita:
Removal of Redundancy in Logic Circuits under Classification of Undetectable Faults.
FTCS 1992: 263-270 |
| 25 | | Xiaoqing Wen,
Kozo Kinoshita:
Testable Designs of Sequential Circuits Under Highly Observable Condition.
ITC 1992: 632-641 |
| 24 | | Yukiya Miura,
Kozo Kinoshita:
Circuit Design for Built-in Current Testing.
ITC 1992: 873-881 |
| 23 | | Xiaoqing Wen,
Kozo Kinoshita:
A Testable Design of Logic Circuits under Highly Observable Condition.
IEEE Trans. Computers 41(5): 654-659 (1992) |
| 1990 |
|---|
| 22 | | Yuzo Takamatsu,
Kozo Kinoshita:
Extended selection of switching target faults in CONT algorithm for test generation.
J. Electronic Testing 1(3): 183-189 (1990) |
| 1989 |
|---|
| 21 | | Manoj Franklin,
Kewal K. Saluja,
Kozo Kinoshita:
Design of a BIST RAM with Row/Column Pattern Sensitive Fault Detection Capability.
ITC 1989: 327-336 |
| 20 | | Noriyoshi Itazaki,
Kozo Kinoshita:
Test pattern generation for circuits with tri-state modules by Z-algorithm.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(12): 1327-1334 (1989) |
| 19 | | Yuzo Takamatsu,
Kozo Kinoshita:
CONT: a concurrent test generation system.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(9): 966-972 (1989) |
| 1986 |
|---|
| 18 | | Noriyoshi Itazaki,
Kozo Kinoshita:
Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm.
ITC 1986: 105-112 |
| 17 | | Kozo Kinoshita,
Kewal K. Saluja:
Built-In Testing of Memory Using an On-Chip Compact Testing Scheme.
IEEE Trans. Computers 35(10): 862-870 (1986) |
| 1985 |
|---|
| 16 | | Hideo Fujiwara,
Kewal K. Saluja,
Kozo Kinoshita:
A Testable Design of Programmable Logic Arrays with Universal Control and Minimal Overhead.
ITC 1985: 574-582 |
| 15 | | C. Boswell,
Kewal K. Saluja,
Kozo Kinoshita:
Design of Programmable Logic Arrays for Parallel Testing.
Comput. Syst. Sci. Eng. 1(1): 5-16 (1985) |
| 14 | | Kewal K. Saluja,
Kozo Kinoshita:
Test Pattern Generation for API Faults in RAM.
IEEE Trans. Computers 34(3): 284-287 (1985) |
| 1984 |
|---|
| 13 | | Kozo Kinoshita,
Kewal K. Saluja:
Built-in Testing of Memory Using On-chip Compact Testing Scheme.
ITC 1984: 271-281 |
| 1983 |
|---|
| 12 | | Takuji Okamoto,
Hiroyuki Shibata,
Kozo Kinoshita:
Design of High-Level Test Language for Digital LSI.
ITC 1983: 508-513 |
| 11 | | Kewal K. Saluja,
Kozo Kinoshita,
Hideo Fujiwara:
An Easily Testable Design of Programmable Logic Arrays for Multiple Faults.
IEEE Trans. Computers 32(11): 1038-1046 (1983) |
| 1981 |
|---|
| 10 | | Hideo Fujiwara,
Kozo Kinoshita:
A Design of Programmable Logic Arrays with Universal Tests.
IEEE Trans. Computers 30(11): 823-828 (1981) |
| 1979 |
|---|
| 9 | | Tsutomu Sasao,
Kozo Kinoshita:
On the Number of Fanout-Free Functions and Unate Cascade Functions.
IEEE Trans. Computers 28(1): 66-72 (1979) |
| 8 | | Tsutomu Sasao,
Kozo Kinoshita:
Conservative Logic Elements and Their Universality.
IEEE Trans. Computers 28(9): 682-685 (1979) |
| 1978 |
|---|
| 7 | | Hideo Fujiwara,
Kozo Kinoshita:
On the Computational Complexity of System Diagnosis.
IEEE Trans. Computers 27(10): 881-885 (1978) |
| 6 | | Tsutomu Sasao,
Kozo Kinoshita:
Cascade Realization of 3-Input 3-Output Conservative Logic Circuits.
IEEE Trans. Computers 27(3): 214-221 (1978) |
| 5 | | Hideo Fujiwara,
Kozo Kinoshita:
Connection Assignments for Probabilistically Diagnosable Systems.
IEEE Trans. Computers 27(3): 280-283 (1978) |
| 4 | | Hideo Fujiwara,
Kozo Kinoshita:
Some Existence Theorems for Probabilistically Diagnosable Systems.
IEEE Trans. Computers 27(4): 379-384 (1978) |
| 3 | | Tsutomu Sasao,
Kozo Kinoshita:
Realization of Minimum Circuits with Two-Input Conservative Logic Elements.
IEEE Trans. Computers 27(8): 749-752 (1978) |
| 1976 |
|---|
| 2 | | Kozo Kinoshita,
Tsutomu Sasao,
Jun Matsuda:
On Magnetic Bubble Logic Circuits.
IEEE Trans. Computers 25(3): 247-253 (1976) |
| 1975 |
|---|
| 1 | | Hideo Fujiwara,
Yoich Nagao,
Tsutomu Sasao,
Kozo Kinoshita:
Easily Testable Sequential Machines with Extra Inputs.
IEEE Trans. Computers 24(8): 821-826 (1975) |
