Stéphane Kirmser

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2006

1 Heinz Mattes, Stéphane Kirmser, Sebastian Sattler: Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation. J. Electronic Testing 22(4-6): 337-350 (2006)

	2006
1		Heinz Mattes, Stéphane Kirmser, Sebastian Sattler: Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation. J. Electronic Testing 22(4-6): 337-350 (2006)

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