Yasuhiro Konishi

	2005
4		Kiyohiro Furutani, Takeshi Hamamoto, Takeo Miki, Masaya Nakano, Takashi Kono, Shigeru Kikuda, Yasuhiro Konishi, Tsutomu Yoshihara: Highly Flexible Row and Column Redundancy and Cycle Time Adaptive Read Data Path for Double Data Rate Synchronous Memories. IEICE Transactions 88-C(2): 255-263 (2005)
	1994
3		Yasuhiro Konishi, T. Ogawa, M. Kumanoya: Testing 256k Word x 16 Bit Cache DRAM (CDRAM). ITC 1994: 360
	1993
2		Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima: Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. IEEE Design & Test of Computers 10(2): 6-12 (1993)
	1992
1		Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikishi, Katsunori Suma, Kazuyasu Fujishima: A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter. ITC 1992: 615-622

Coauthor Index

1	Kazutami Arimoto	[1] [2]
2	Kazuyasu Fujishima	[1] [2]
3	Kiyohiro Furutani	[4]
4	Takeshi Hamamoto	[4]
5	Masanori Hayashikishi	[1]
6	Masanori Hayashikoshi	[2]
7	Hideto Hidaka	[1] [2]
8	Shigeru Kikuda	[4]
9	Takashi Kono	[4]
10	M. Kumanoya	[3]
11	Takeo Miki	[4]
12	Masaya Nakano	[4]
13	T. Ogawa	[3]
14	Katsuhiro Suma	[2]
15	Katsunori Suma	[1]
16	Masaki Tsukude	[1] [2]
17	Tsutomu Yoshihara	[4]

Colors in the list of coauthors