 | 2008 |
|---|
| 9 |       | Heinrich Theodor Vierhaus,
René Kothe:
Embedded Diagnostic Logic Test Exploiting Regularity.
DSD 2008: 873-879 |
| 2007 |
|---|
| 8 |  | René Kothe,
Heinrich Theodor Vierhaus:
Flip-Flops and Scan-Path Elements for Nanoelectronics.
DDECS 2007: 307-312 |
| 7 | | R. Frost Brandenburg,
D. Rudolph,
Christian Galke,
René Kothe,
Heinrich Theodor Vierhaus:
A Configurable Modular Test Processor and Scan Controller Architecture.
IOLTS 2007: 277-284 |
| 2006 |
|---|
| 6 | | Christian Galke,
René Kothe,
Heinrich Theodor Vierhaus:
Logic Self Repair.
ARCS Workshops 2006: 36-44 |
| 5 | | René Kothe,
Christian Galke,
S. Schultke,
H. Froeschke,
S. Gaede,
Heinrich Theodor Vierhaus:
Hardware/Software Based Hierarchical Self Test for SoCs.
DDECS 2006: 159-160 |
| 4 | | René Kothe,
Heinrich Theodor Vierhaus,
Torsten Coym,
Wolfgang Vermeiren,
Bernd Straube:
Embedded Self Repair by Transistor and Gate Level Reconfiguration.
DDECS 2006: 210-215 |
| 3 | | Christian Galke,
René Kothe,
S. Schultke,
K. Winkler,
J. Honko,
Heinrich Theodor Vierhaus:
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.
IOLTS 2006: 181-182 |
| 2 | | S. Habermann,
René Kothe,
Heinrich Theodor Vierhaus:
Built-in Self Repair by Reconfiguration of FPGAs.
IOLTS 2006: 187-188 |
| 2005 |
|---|
| 1 | | René Kothe,
Christian Galke,
Heinrich Theodor Vierhaus:
A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.
IOLTS 2005: 241-246 |
